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Register a new userPhotonic force optical coherence elastography for three-dimensional mechanical microscopy
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Added by
Nichaluk Leartprapun
Publication date
2017
fields
Physics
and research's language is
English
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Optical tweezers are an invaluable tool for non-contact trapping and micro-manipulation, but their ability to facilitate high-throughput volumetric microrheology of biological samples for mechanobiology research is limited by the precise alignment associated with the excitation and detection of individual bead oscillations. In contrast, radiation pressure from a low numerical aperture optical beam can apply transversely localized force over an extended depth range. We propose photonic force optical coherence elastography (PF-OCE), leveraging phase-sensitive interferometric detection to track sub-nanometre oscillations of beads, embedded in viscoelastic hydrogels, induced by modulated radiation pressure. Since the displacements caused by ultra-low radiation-pressure force are typically obscured by absorption-mediated thermal effects, mechanical responses of the beads were isolated after independent measurement and decoupling of the photothermal response of the hydrogels. Volumetric imaging of bead mechanical responses in hydrogels with different agarose concentrations by PF-OCE was consistent with bulk mechanical characterization of the hydrogels by shear rheometry.
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A photonic force microscope comprises of an optically trapped micro-probe and a position detection system to track the motion of the probe. Signal collection for motion detection is often carried out using the backscattered light off the probe - however, this mode has problems of low S/N due to the small back-scattering cross-sections of the micro-probes typically used. The position sensors often used in these cases are quadrant photodetectors. To ensure maximum sensitivity of such detectors, it would help if the detector size matched with the detection beam radius after the condenser lens (which for backscattered detection would be the trapping objective itself). To suit this condition, we have used a miniature displacement sensor whose dimensions makes it ideal to work with 1:1 images of micron-sized trapped probes in the back-scattering detection mode. The detector is based on the quadrant photo-IC in the optical pick-up head of a compact disc player. Using this detector, we measured absolute displacements of an optically trapped 1.1 um probe with a resolution of ~10 nm for a bandwidth of 10 Hz at 95% significance without any sample or laser stabilization. We characterized our optical trap for different sized probes by measuring the power spectrum for each probe to 1% accuracy, and found that for 1.1 um diameter probes, the noise in our position measurement matched the thermal resolution limit for averaging times up to 10 ms. We also achieved a linear response range of around 385 nm with crosstalk between axes ~4% for 1.1 um diameter probes. The detector has extremely high bandwidth (few MHz) and low optical power threshold - other factors that can lead to its widespread use in photonic force microscopy.
Atomic force microscopy (AFM) has been constantly supporting nanosciences and nanotechnologies for over 30 years, being present in many fields from condensed matter physics to biology. It enables measuring very weak forces at the nanoscale, thus elucidating interactions at play in fundamental processes. Here we leverage the combined benefits of micro/nanoelectromechanical systems and cavity optomechanics to fabricate a sensor for dynamic mode AFM at a frequency above 100 MHz. This is two decades above the fastest commercial AFM probes, suggesting opportunity for measuring forces at timescales unexplored so far. The fabrication is achieved using very-large scale integration technologies inherited from photonic silicon circuits. The probes ring optomechanical cavity is coupled to a 1.55 um laser light and features a 130 MHz mechanical resonance mode with a quality factor of 900 in air. A limit of detection in displacement of 3.10-16 m/sqrt(Hz) is obtained, enabling the detection of the Brownian motion of the probe and paving the way for force sensing experiments in the dynamic mode with a working vibration amplitude in the picometer range. Inserted in a custom AFM instrument embodiment, this optomechanical sensor demonstrates the capacity to perform force-distance measurements and to maintain a constant interaction strength between tip and sample, an essential requirement for AFM applications. Experiments show indeed a stable closed-loop operation with a setpoint of 4 nN/nm for an unprecedented sub-picometer vibration amplitude, where the tip-sample interaction is mediated by a stretched water meniscus.
In atomic force microscopy (AFM), the exchange and alignment of the AFM cantilever with respect to the optical beam and position-sensitive detector (PSD) are often performed manually. This process is tedious and time-consuming and sometimes damages the cantilever or tip. To increase the throughput of AFM in industrial applications, the ability to automatically exchange and align the cantilever in a very short time with sufficient accuracy is required. In this paper, we present the development of an automated cantilever exchange and optical alignment instrument. We present an experimental proof of principle by exchanging various types of AFM cantilevers in 6 seconds with an accuracy better than 2 um. The exchange and alignment unit is miniaturized to allow for integration in a parallel AFM. The reliability of the demonstrator has also been evaluated. Ten thousand continuous exchange and alignment cycles were performed without failure. The automated exchange and alignment of the AFM cantilever overcome a large hurdle toward bringing AFM into high-volume manufacturing and industrial applications.
We present the results of mechanical characterizations of many different high-quality optical coatings made of ion-beam-sputtered titania-doped tantala and silica, developed originally for interferometric gravitational-wave detectors. Our data show that in multi-layer stacks (like high-reflection Bragg mirrors, for example) the measured coating dissipation is systematically higher than the expectation and is correlated with the stress condition in the sample. This has a particular relevance for the noise budget of current advanced gravitational-wave interferometers, and, more generally, for any experiment involving thermal-noise limited optical cavities.
Scattering-type scanning near-field optical microscopy (s-SNOM) is instrumental in exploring polaritonic behaviors of two-dimensional (2D) materials at the nanoscale. A sharp s-SNOM tip couples momenta into 2D materials through phase matching to excite phonon polaritons, which manifest as nanoscale interference fringes in raster images. However, s-SNOM lacks the ability to detect the progression of near-field property along the perpendicular axis to the surface. Here, we perform near-field analysis of a micro-disk and a reflective edge made of isotopically pure hexagonal boron nitride (h-11BN), by using three-dimensional near-field response cubes obtained by peak force scattering-type near-field optical microscopy (PF-SNOM). Momentum quantization of polaritons from the confinement of the circular structure is revealed in situ. Moreover, tip-sample distance is found to be capable of fine-tuning the momentum of polaritons and modifying the superposition of quantized polaritonic modes. The PF-SNOM-based three-dimensional near-field analysis provides detailed characterization capability with a high spatial resolution to fully map three-dimensional near-fields of nano-photonics and polaritonic structures.
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