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Register a new userA Review and Outlook for the Removal of Radon-Generated Po-210 Surface Contamination
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The next generation low-background detectors operating deep underground aim for unprecedented low levels of radioactive backgrounds. The deposition and presence of radon progeny on detector surfaces is an added source of energetic background events. In addition to limiting the detector materials radon exposure in order to reduce potential surface backgrounds, it is just as important to clean surfaces to remove inevitable contamination. Such studies of radon progeny removal have generally found that a form of etching is effective at removing some of the progeny (Bi and Pb), however more aggressive techniques, including electropolishing, have been shown to effectively remove the Po atoms. In the absence of an aggressive etch, a significant fraction of the Po atoms are believed to either remain behind within the surface or redeposit from the etching solution back onto the surface. We explore the chemical nature of the aqueous Po ions and the effect of the oxidation state of Po to maximize the Po ions remaining in the etching solution of contaminated Cu surfaces. We present a review of the previous studies of surface radon progeny removal and our findings on the role of oxidizing agents and a cell potential in the preparation of a clean etching technique.
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Clean materials are required to construct and operate many low-background physics experiments. High-purity copper has found broad use because of its physical properties and availability. In this paper, we describe methods to assay and mitigate $^{210}$Pb contamination on copper surfaces, such as from exposure to environmental radon or coming from bulk impurities. We evaluated the efficacy of wet etching on commercial samples and observed that $^{210}$Po contamination from the copper bulk does not readily pass into solution. During the etch, the polonium appears to trap at the copper-etchant boundary, such that it is effectively concentrated at the copper surface. We observed a different behavior for $^{210}$Pb; high-sensitivity measurements of the alpha emissivity versus time indicate the lowest level of $^{210}$Pb contamination ever reported for a commercial copper surface: $0pm12$ nBq/cm$^2$ (1$sigma$). Additionally, we have demonstrated the effectiveness of mitigating trace $^{210}$Pb and $^{210}$Po surface backgrounds using custom, high-purity electroplating techniques. These approaches were evaluated utilizing assays performed with an XIA UltraLo-1800 alpha spectrometer.
We established a method to assay $^{210}$Pb and $^{210}$Po contaminations in the bulk of copper samples using a low-background alpha particle counter. The achieved sensitivity for the $^{210}$Pb and $^{210}$Po contaminations reaches a few mBq/kg. Due to this high sensitivity, the $^{210}$Pb and $^{210}$Po contaminations in oxygen free copper bulk were identified and measured for the first time. The $^{210}$Pb contaminations of our oxygen free copper samples were 17-40 mBq/kg. Based on our investigation of copper samples in each production step, the $^{210}$Pb in oxygen free copper was understood to be a small residual of an electrolysis process. This method to measure bulk contaminations of $^{210}$Pb and $^{210}$Po could be applied to other materials.
An online cryogenic distillation system for the removal of krypton and radon from xenon was designed and constructed for PandaX-4T, a highly sensitive dark matter detection experiment. The krypton content in a commercial xenon product is expected to be reduced by 7 orders of magnitude with 99% xenon collection efficiency at a flow rate of 10 kg/h by design. The same system can reduce radon content in xenon by reversed operation, with an expected radon reduction factor of about 1.8 in PandaX-4T under a flow rate of 56.5 kg/h. The commissioning of this system was completed, with krypton and radon operations tested under respective working conditions. The krypton concentration of the product xenon was measured with an upper limit of 8.0 ppt.
Material screening for identifying low-energy electron emitters and alpha-decaying isotopes is now a prerequisite for rare-event searches (e.g., dark-matter direct detection and neutrinoless double-beta decay) for which surface radiocontamination has become an increasingly important background. The BetaCage, a gaseous neon time-projection chamber, is a proposed ultra-sensitive (and nondestructive) screener for alpha- and beta-emitting surface contaminants to which existing screening facilities are insufficiently sensitive. Sensitivity goals are 0.1 betas per keV-m$^2$-day and 0.1 alphas per m$^2$-day, with the former limited by Compton scattering of photons in the screening samples and (thanks to tracking) the latter expected to be signal-limited; radioassays and simulations indicate backgrounds from detector materials and radon daughters should be subdominant. We report on details of the background simulations and detector design that provide the discrimination, shielding, and radiopurity necessary to reach our sensitivity goals for a chamber with a 95$times$95 cm$^2$ sample area positioned below a 40 cm drift region and monitored by crisscrossed anode and cathode planes consisting of 151 wires each.
The removal of radioactivity from liquid scintillator has been studied in preparation of a low background phase of KamLAND. This paper describes the methods and techniques developed to measure and efficiently extract radon decay products from liquid scintillator. We report the radio-isotope reduction factors obtained when applying various extraction methods. During this study, distillation was identified as the most efficient method for removing radon daughters from liquid scintillator.
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