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Register a new userSurface and edge resonances of phonon-polaritons in scattering-type near-field optical microscopy
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Viktoriia Babicheva
Publication date
2017
fields
Physics
and research's language is
English
Authors
Viktoriia E. Babicheva
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We theoretically study resonance responses of flat surfaces and sharp edges of the nanostructures that support excitations of phonon-polaritons in mid-infrared range. We focus on two materials: silicon carbide that has a nearly isotropic permittivity and hexagonal boron nitride that has a strong anisotropy and spectral band with hyperbolic dispersion. We aim to predict scattering-type near-field optical microscope (s-SNOM) response and develop a modeling approach that adequately describes the resonant behavior of the nanostructure with phonon-polaritons. The previously employed technique assumes dipole scattering from the tip and allows calculating s-SNOM signal in different demodulation orders by modeling full structure, any tip positions, and vertical scans, which works well for the structures with only one hot spot, e.g. flat surfaces. In the structures of complex shapes, hot-spot places are unknown, and analysis of light absorption in the whole apex is the best way to account for all hot spots and field enhancement. We show that calculation of demodulation orders of light absorption in the tip is an alternative way to predict s-SNOM signal, and it is preferred for the structures of complex shapes with strong resonances, where dipole approximation of the tip is not valid.
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Scattering-type scanning near-field optical microscopy (s-SNOM) is instrumental in exploring polaritonic behaviors of two-dimensional (2D) materials at the nanoscale. A sharp s-SNOM tip couples momenta into 2D materials through phase matching to excite phonon polaritons, which manifest as nanoscale interference fringes in raster images. However, s-SNOM lacks the ability to detect the progression of near-field property along the perpendicular axis to the surface. Here, we perform near-field analysis of a micro-disk and a reflective edge made of isotopically pure hexagonal boron nitride (h-11BN), by using three-dimensional near-field response cubes obtained by peak force scattering-type near-field optical microscopy (PF-SNOM). Momentum quantization of polaritons from the confinement of the circular structure is revealed in situ. Moreover, tip-sample distance is found to be capable of fine-tuning the momentum of polaritons and modifying the superposition of quantized polaritonic modes. The PF-SNOM-based three-dimensional near-field analysis provides detailed characterization capability with a high spatial resolution to fully map three-dimensional near-fields of nano-photonics and polaritonic structures.
We present combined experimental and numerical work on light-matter interactions at nanometer length scales. We report novel numerical simulations of near-field infrared nanospectroscopy that consider, for the first time, detailed tip geometry and have no free parameters. Our results match published spectral shapes of amplitude and phase measurements even for strongly resonant surface phonon-polariton (SPhP) modes. They also verify published absolute scattering amplitudes for the first time. A novel, ultrabroadband light source enables near-field amplitude and phase acquisition into the far-infrared spectral range. This allowed us to discover a strong SPhP resonance in the polar dielectric SrTiO3 (STO) at approximately 24 micrometer wavelength of incident light.
Optical spin angular momenta in a confined electromagnetic field exhibit remarkable difference with their free space counterparts, in particular, the optical transverse spin that is locked with the energy propagating direction lays the foundation for many intriguing physical effects such as unidirectional transportation, quantum spin Hall effect, photonic Skyrmion, etc. In order to investigate the underlying physics behind the spin-orbit interactions as well as to develop the optical spin-based applications, it is crucial to uncover the spin texture in a confined field, yet it faces challenge due to their chiral and near-field vectorial features. Here, we propose a scanning imaging technique which can map the near-field distributions of the optical spin angular momenta with an achiral dielectric nanosphere. The spin angular momentum component normal to the interface can be uncovered experimentally by employing the proposed scanning imaging technique and the three-dimensional spin vector can be reconstructed theoretically with the experimental results. The experiment is demonstrated on the example of surface plasmon polaritons excited by various vector vortex beams under a tight-focusing configuration, where the spin-orbit interaction emerges clearly. The proposed method, which can be utilized to reconstruct the photonic Skyrmion and other photonic topological structures, is straightforward and of high precision, and hence it is expected to be valuable for the study of near-field spin optics and topological photonics.
A signature of the scattering between microcavity polaritons and longitudinal optical phonons has been observed in the electroluminescence spectrum of an intersubband device operating in the light-matter strong coupling regime. By electrical pumping we resonantly populate the upper polariton branch at different energies as a function of the applied bias. The electroluminescent signal arising from these states is seconded by a phonon replica from the lower branch.
Imaging dynamical processes at interfaces and on the nanoscale is of great importance throughout science and technology. While light-optical imaging techniques often cannot provide the necessary spatial resolution, electron-optical techniques damage the specimen and cause dose-induced artefacts. Here, Optical Near-field Electron Microscopy (ONEM) is proposed, an imaging technique that combines non-invasive probing with light, with a high spatial resolution read-out via electron optics. Close to the specimen, the optical near-fields are converted into a spatially varying electron flux using a planar photocathode. The electron flux is imaged using low energy electron microscopy, enabling label-free nanometric resolution without the need to scan a probe across the sample. The specimen is never exposed to damaging electrons.
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