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Register a new userPico- and nanosecond laser ablation of mixed tungsten / aluminium films
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In order to extend the investigation of laser-assisted cleaning of ITER-relevant first mirror materials to the picosecond regime, a commercial laser system delivering 10 picosecond pulses at 355 nm at a frequency of up to 1 MHz has been used to investigate the ablation of mixed aluminium (oxide) / tungsten (oxide) layers deposited on poly- and nanocrystalline molybdenum as well as nanocrystalline rhodium mirrors. Characterization before and after cleaning using scanning electron microscopy (SEM) and spectrophotometry shows heavy dust formation, resulting in a degradation of the reflectivity. Cleaning using a 5 nanosecond pulses at 350 and 532 nm, on the other hand, proved very promising. The structure of the film remnants suggests that in this case buckling was the underlying removal mechanism rather than ablation. Repeated coating and cleaning using nanosecond pulses is demonstrated.
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Thin films of the molecular magnet Mn12-acetate, [Mn12 O12(CH3COO)16 (H2O)4] 2CH3COOH 4H2O, have been prepared using a laser ablation technique with a nitrogen laser at low laser energies of 0.8 and 2 mJ. Chemical and magnetic characterizations show that the Mn12-acetate cores remain intact and the films show similar magnetic properties to those of the parent molecular starting material. In addition, the magnetic data exhibit a peak in the magnetization at 27 K indicating the creation of an additional magnetic phase not noted in previous studies of crystalline phases.
Recent advances in high-throughput experimentation for combinatorial studies have accelerated the discovery and analysis of materials across a wide range of compositions and synthesis conditions. However, many of the more powerful characterization methods are limited by speed, cost, availability, and/or resolution. To make efficient use of these methods, there is value in developing approaches for identifying critical compositions and conditions to be used as a-priori knowledge for follow-up characterization with high-precision techniques, such as micron-scale synchrotron based X-ray diffraction (XRD). Here we demonstrate the use of optical microscopy and reflectance spectroscopy to identify likely phase-change boundaries in thin film libraries. These methods are used to delineate possible metastable phase boundaries following lateral-gradient Laser Spike Annealing (lg-LSA) of oxide materials. The set of boundaries are then compared with definitive determinations of structural transformations obtained using high-resolution XRD. We demonstrate that the optical methods detect more than 95% of the structural transformations in a composition-gradient La-Mn-O library and a Ga$_2$O$_3$ sample, both subject to an extensive set of lg-LSA anneals. Our results provide quantitative support for the value of optically-detected transformations as a priori data to guide subsequent structural characterization, ultimately accelerating and enhancing the efficient implementation of $mu$m-resolution XRD experiments.
Neutron reflectometry is a powerful tool used for studies of surfaces and interfaces. In general the absorption in the typical studied materials can be neglected and this technique is limited to the measurement of the reflectivity only. In the case of strongly absorbing nuclei the number of neutrons is not conserved and the absorption can be directly measured by using the neutron-induced fluorescence technique which exploits the prompt particle emission of absorbing isotopes. This technique is emerging from soft matter and biology where highly absorbing nuclei, generally in very small quantities, are used as a label for buried layers. Nowadays the importance of highly absorbing layers is rapidly increasing, partially because of their application in neutron detection; a field that has become more and more active also due to the 3He-shortage. In this manuscript we extend the neutron-induced fluorescence technique to the study of thick layers of highly absorbing materials; in particular 10B4C. The theory of neutron reflectometry is a commonly studied topic, however the subtle relationship between the reflection and the absorption of neutrons is not widely known, in particular when a strong absorption is present. The theory for a general stack of absorbing layers has been developed and compared to measurements. This new technique has potential as a tool for characterization of highly absorbing layers. We also report on the requirements that a 10B4C layer must fulfill in order to be employed as a converter in neutron detection.
We report the structural and electrical characterization of tungsten oxides formed by illuminating multi-layer tungsten diselenide (WSe2) nanosheets with an intense laser beam in the ambient environment. A noninvasive microwave impedance microscope (MIM) was used to perform electrical imaging of the samples. The local conductivity ~100 S/m of the oxidized product, measured by the MIM and conventional transport experiments, is much higher than that of the pristine WSe2, suggesting the formation of sub-stoichiometric WO3-x polycrystals with n-type carriers. With further efforts to improve the conductivity of the oxides, the laser-assisted oxidation process may be useful for patterning conductive features on WSe2 or forming electrical contacts to various transition metal dichalcogenides.
In this article, fractal concepts were used to explore the thermally evaporated potassium bromide thin films of different thicknesses 200, 300, and 500 nm respectively; grown on aluminium substrates at room temperature. The self-affine or self similar nature of growing surfaces was investigated by autocorrelation function and obtained results are compared with the morphological envelope method. Theoretical estimations revealed that the global surface parameters such as, interface width and lateral correlation length are monotonically decreased with increasing film thickness. Also, from height profile and A-F plots, it has been perceived that irregularity/ complexity of growing layers was significantly influenced by thickness. On the other hand, the fractal dimension and local roughness exponent, estimated by height-height correlation function, do not suggest such dependency.
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