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Quantifying the intrinsic amount of fabrication disorder in photonic-crystal waveguides from optical far-field intensity measurements

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 Publication date 2012
  fields Physics
and research's language is English




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Residual disorder due to fabrication imperfections has important impact in nanophotonics where it may degrade device performance by increasing radiation loss or spontaneously trap light by Anderson localization. We propose and demonstrate experimentally a method of quantifying the intrinsic amount of disorder in state-of-the-art photonic-crystal waveguides from far-field measurements of the Anderson-localized modes. This is achieved by comparing the spectral range that Anderson localization is observed to numerical simulations and the method offers sensitivity down to ~ 1 nm.



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We introduce a weakly coupled photonic crystal waveguide as a promising and realistic model for all-optical amplification. A symmetric pillar type coupled photonic crystal waveguide consisting of dielectric rods periodically distributed in a free space is proposed as all-optical amplifier. Using the unique features of the photonic crystals to control and guide the light, we have properly chosen the frequency at which only one mode (odd mode) becomes the propagating mode in the coupled photonic crystal waveguide, whereas another mode (even mode) is completely reflected from the guiding structure. Under this condition, the all-optical amplification is fully realized. The amplification coefficient for the continuous signal and the Gaussian pulse is calculated.
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