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Register a new userPhotonic-Crystal Waveguides with Disorder: Measurement of a Band-Edge Tail in the Density of States
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We measure localized and extended mode profiles at the band edge of slow-light photonic-crystal waveguides using phase-sensitive near-field microscopy. High-resolution band structures are obtained and interpreted, allowing the retrieval of the optical density of states (DOS). This constitutes a first observation of the DOS of a periodic system with weak disorder. The Van Hove singularity in the DOS expected at the band edge of an ideal 1D periodic structure is removed by the disorder. The Anderson-localized states form a tail in the density of states, as predicted by Lifshitz for solid-state systems.
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Residual disorder due to fabrication imperfections has important impact in nanophotonics where it may degrade device performance by increasing radiation loss or spontaneously trap light by Anderson localization. We propose and demonstrate experimentally a method of quantifying the intrinsic amount of disorder in state-of-the-art photonic-crystal waveguides from far-field measurements of the Anderson-localized modes. This is achieved by comparing the spectral range that Anderson localization is observed to numerical simulations and the method offers sensitivity down to ~ 1 nm.
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