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Register a new userBias asymmetry in the conductance profile of magnetic ions on surfaces probed by scanning tunneling microscopy
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The conductance profiles of magnetic transition metal atoms, such as Fe, Co and Mn, deposited on surfaces and probed by a scanning tunneling microscope (STM), provide detailed information on the magnetic excitations of such nano-magnets. In general the profiles are symmetric with respect to the applied bias. However a set of recent experiments has shown evidence for inherent asymmetries when either a normal or a spin-polarized STM tip is used. In order to explain such asymmetries here we expand our previously developed perturbative approach to electron-spin scattering to the spin- polarized case and to the inclusion of out of equilibrium spin populations. In the case of a magnetic STM tip we demonstrate that the asymmetries are driven by the non-equilibrium occupation of the various atomic spin-levels, an effect that reminds closely that electron spin-transfer. In contrast when the tip is not spin-polarized such non-equilibrium population cannot be build up. In this circumstance we propose that the asymmetry simply originates from the transition metal ion density of state, which is included here as a non-vanishing real component to the spin-scattering self-energy.
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Pseudospin, an additional degree of freedom related to the honeycomb structure of graphene, is responsible of many of the outstanding electronic properties found in this material. This article provides a clear understanding of how such pseudospin impacts the quasiparticle interferences of monolayer (ML) and bilayer (BL) graphene measured by low temperature scanning tunneling microscopy and spectroscopy. We have used this technique to map, with very high energy and space resolution, the spatial modulations of the local density of states of ML and BL graphene epitaxialy grown on SiC(0001), in presence of native disorder. We perform a Fourier transform analysis of such modulations including wavevectors up to unit-vectors of the reciprocal lattice. Our data demonstrate that the quasiparticle interferences associated to some particular scattering processes are suppressed in ML graphene, but not in BL graphene. Most importantly, interferences with 2qF wavevector associated to intravalley backscattering are not measured in ML graphene, even on the images with highest resolution. In order to clarify the role of the pseudospin on the quasiparticle interferences, we use a simple model which nicely captures the main features observed on our data. The model unambiguously shows that graphenes pseudospin is responsible for such suppression of quasiparticle interferences features in ML graphene, in particular for those with 2qF wavevector. It also confirms scanning tunneling microscopy as a unique technique to probe the pseudospin in graphene samples in real space with nanometer precision. Finally, we show that such observations are robust with energy and obtain with great accuracy the dispersion of the pi-bands for both ML and BL graphene in the vicinity of the Fermi level, extracting their main tight binding parameters.
Tunneling magnetoresistance (TMR) in a vertical manganite junction was investigated by low-temperature scanning laser microscopy (LTSLM) allowing to determine the local relative magnetization M orientation of the two electrodes as a function of magnitude and orientation of the external magnetic field H. Sweeping the field amplitude at fixed orientation revealed magnetic domain nucleation and propagation in the junction electrodes. For the high-resistance state an almost single-domain antiparallel magnetization configuration was achieved, while in the low-resistance state the junction remained in a multidomain state. Calculated resistance $R_mathrm{calc}(H)$ based on the local M configuration obtained by LTSLM is in quantitative agreement with R(H) measured by magnetotransport.
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Nanoscale 3D surface modifications, by scanning tunneling microscopy under ambient conditions, of La0.7Sr0.3MnO3 thin films have been performed. It was demonstrated that there are well defined combinations of bias voltages and scan speeds which allow for controlled surface structuring. Lateral structures with sizes down to 1.5 nm are possible to obtain. Moreover, it is possible to reproducibly control the depth of etching with half a unit cell precision, enabling design of 3D surface structures and control of the surface termination of La0.7Sr0.3MnO3 through etching.
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