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Register a new userAnalysis of Coherence Properties of 3-rd Generation Synchrotron Sources and Free-Electron Lasers
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A general theoretical approach based on the results of statistical optics is used for the analysis of the transverse coherence properties of 3-rd generation synchrotron sources and x-ray free-electron lasers (XFEL). Correlation properties of the wavefields are calculated at different distances from an equivalent Gaussian Schell-model source. This model is used to describe coherence properties of the five meter undulator source at the synchrotron storage ring PETRA III. In the case of XFEL sources the decomposition of the statistical fields into a sum of independently propagating transverse modes is used for the analysis of the coherence properties of these new sources. A detailed calculation is performed for the parameters of the SASE1 undulator at the European XFEL. It is demonstrated that only a few modes contribute significantly to the total radiation field of that source.
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An analytical approach describing properties of focused partially coherent X-ray beams is presented. The method is based on the results of statistical optics and gives both the beam size and transverse coherence length at any distance behind an optical element. In particular, here we consider Gaussian Schell-model beams and thin optical elements. Limiting cases of incoherent and fully coherent illumination of the focusing element are discussed. The effect of the beam defining aperture, typically used in combination with focusing elements at synchrotron sources to improve transverse coherence, is also analyzed in detail. As an example the coherence properties in the focal region of compound refractive lenses at the PETRA III synchrotron source are analyzed.
The experimental characterization of the spatial and temporal coherence properties of the free-electron laser in Hamburg (FLASH) at a wavelength of 8.0 nm is presented. Double pinhole diffraction patterns of single femtosecond pulses focused to a size of about 10 microns by 10 microns were measured. A transverse coherence length of 6.2 microns in the horizontal and 8.7 microns in the vertical direction was determined from the most coherent pulses. Using a split and delay unit the coherence time of the pulses produced in the same operation conditions of FLASH was measured to be 1.75 fs. From our experiment we estimated the degeneracy parameter of the FLASH beam to be on the order of $10^{10}$ to $10^{11}$, which exceeds the values of this parameter at any other source in the same energy range by many orders of magnitude.
In this paper we discuss extending the operating wavelength range of tunable Regenerative Amplifier FELs to shorter wavelengths than current design proposals, notably into the XUV regions of the spectrum and beyond where the reflectivity of broadband optics is very low. Simulation studies are presented which demonstrate the development of good temporal coherence in generic systems with a broadband radiation feedback of less than one part in ten thousand.
We demonstrate the possibility to run a single-pass free-electron laser in a new dynamical regime, which can be exploited to perform two-colour pump-probe experiments in the VUV/X-ray domain, using the free-electron laser emission both as a pump and as a probe. The studied regime is induced by triggering the free-electron laser process with a powerful laser pulse, carrying a significant and adjustable frequency chirp. As a result, the emitted light is eventually split in two sub-pulses, whose spectral and temporal separations can be independently controlled. We provide a theoretical description of this phenomenon, which is found in good agreement with experiments performed on the FERMI@Elettra free-electron laser.
Frequency pulling is a well-known phenomenon in standard laser physics, leading to a shift of the laser frequency when the cavity and maximum gain frequencies are detuned. In this letter we present the first experimental demonstration of frequency pulling in single-pass free-electron lasers. Measurements are performed using the single-pass free-electron laser installed on the Elettra storage ring.
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