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Register a new userLocal tunneling probe of (110) Y_0.95Ca_0.05Ba_2Cu_3O_7-delta thin films in a magnetic field
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Scanning tunneling spectroscopy was performed on (110)-oriented thin films of Ca-overdoped Y$_{0.95}$Ca$_{0.05}$Ba$_2$Cu$_3$O$_{7-delta}$ at 4.2K, to probe the local evolution of Andreev$-$Saint-James surface states in a c-axis magnetic field. In zero field, we observed conductance spectra with spontaneously-split peaks and spectra with unsplit zero-bias peaks. The former showed enhanced splitting with field, and the latter showed threshold splitting above finite fields. Although both field evolutions can be described in terms of screening and orbital supercurrents, within the framework of $dpm ialpha$ pairing ($d$=$d_{x^2-y^2}$; $alpha$=$d_{xy}$,$s$), the enhanced splitting is consistent with only the $d$ + $ialpha$ state. Our results have direct implications on the stability of broken time-reversal symmetry in cuprate superconductors.
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We report a study of the microwave conductivity of electron-doped Pr$_{1.85}$Ce$_{0.15}$CuO$_{4-delta}$ superconducting thin films using a cavity perturbation technique. The relative frequency shifts obtained for the samples placed at a maximum electric field location in the cavity are treated using the high conductivity limit presented recently by Peligrad $textit{et}$ $textit{al.}$ Using two resonance modes, TE$_{102}$ (16.5 GHz) and TE$_{101}$ (13 GHz) of the same cavity, only one adjustable parameter $Gamma$ is needed to link the frequency shifts of an empty cavity to the ones of a cavity loaded with a perfect conductor. Moreover, by studying different sample configurations, we can relate the substrate effects on the frequency shifts to a scaling factor. These procedures allow us to extract the temperature dependence of the complex penetration depth and the complex microwave conductivity of two films with different quality. Our data confirm that all the physical properties of the superconducting state are consistent with an order parameter with lines of nodes. Moreover, we demonstrate the high sensitivity of these properties on the quality of the films.
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