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EDA Publishing Association
Publication date
2007
fields
Informatics Engineering
and research's language is
English
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This paper describes a flexible logic BIST scheme that features high fault coverage achieved by fault-simulation guided test point insertion, real at-speed test capability for multi-clock designs without clock frequency manipulation, and easy physical implementation due to the use of a low-speed SE signal. Application results of this scheme to two widely used IP cores are also reported.
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In this paper we describe how we applied a BIST-based approach to the test of a logic core to be included in System-on-a-chip (SoC) environments. The approach advantages are the ability to protect the core IP, the simple test interface (thanks also to the adoption of the P1500 standard), the possibility to run the test at-speed, the reduced test time, and the good diagnostic capabilities. The paper reports figures about the achieved fault coverage, the required area overhead, and the performance slowdown, and compares the figures with those for alternative approaches, such as those based on full scan and sequential ATPG.
Object detection is widely used on embedded devices. With the wide availability of CNN (Convolutional Neural Networks) accelerator chips, the object detection applications are expected to run with low power consumption, and high inference speed. In addition, the CPU load is expected to be as low as possible for a CNN accelerator chip working as a co-processor with a host CPU. In this paper, we optimize the object detection model on the CNN accelerator chip by minimizing the CPU load. The resulting model is called GnetDet. The experimental result shows that the GnetDet model running on a 224mW chip achieves the speed of 106FPS with excellent accuracy.
The globalization of the electronics supply chain is requiring effective methods to thwart reverse engineering and IP theft. Logic locking is a promising solution but there are still several open concerns. Even when applied at high level of abstraction, logic locking leads to large overhead without guaranteeing that the obfuscation metric is actually maximized. We propose a framework to optimize the use of behavioral logic locking for a given security metric. We explore how to apply behavioral logic locking techniques during the HLS of IP cores. Operating on the chip behavior, our method is compatible with commercial HLS tools, complementing existing industrial design flows. We offer a framework where the designer can implement different meta-heuristics to explore the design space and select where to apply logic locking. Our method optimizes a given security metric better than complete obfuscation, allows us to 1) obtain better protection, 2) reduce the obfuscation cost.
We have designed and tested a parallel 8-bit ERSFQ arithmetic logic unit (ALU). The ALU design employs wave-pipelined instruction execution and features modular bit-slice architecture that is easily extendable to any number of bits and adaptable to current recycling. A carry signal synchronized with an asynchronous instruction propagation provides the wave-pipeline operation of the ALU. The ALU instruction set consists of 14 arithmetical and logical instructions. It has been designed and simulated for operation up to a 10 GHz clock rate at the 10-kA/cm2 fabrication process. The ALU is embedded into a shift-register-based high-frequency testbed with on-chip clock generator to allow for comprehensive high frequency testing for all possible operands. The 8-bit ERSFQ ALU, comprising 6840 Josephson junctions, has been fabricated with MIT Lincoln Lab 10-kA/cm2 SFQ5ee fabrication process featuring eight Nb wiring layers and a high-kinetic inductance layer needed for ERSFQ technology. We evaluated the bias margins for all instructions and various operands at both low and high frequency clock. At low frequency, clock and all instruction propagation through ALU were observed with bias margins of +/-11% and +/-9%, respectively. Also at low speed, the ALU exhibited correct functionality for all arithmetical and logical instructions with +/-6% bias margins. We tested the 8-bit ALU for all instructions up to 2.8 GHz clock frequency.
Triple Modular Redundancy (TMR) is a suitable fault tolerant technique for SRAM-based FPGA. However, one of the main challenges in achieving 100% robustness in designs protected by TMR running on programmable platforms is to prevent upsets in the routing from provoking undesirable connections between signals from distinct redundant logic parts, which can generate an error in the output. This paper investigates the optimal design of the TMR logic (e.g., by cleverly inserting voters) to ensure robustness. Four differe
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