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Register a new userCritical charge dynamics of superconducting LSCO thin films probed by complex microwave spectroscopy: Anomalous changes of the universality class by hole doping
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We study the critical charge dynamics of the superconducting to the normal-state transition for LSCO thin films with a wide range of the Sr concentration, by measuring the frequency-dependent excess parts of the complex microwave conductivity, which is induced by the superconducting fluctuations. We present a dynamic scaling analysis of the complex fluctuation conductivity, which includes the information on the universality class and the dimensionality of the critical charge dynamics as a function of the Sr concentration, the film thickness and the magnetic field. In our previous study (H. Kitano et al., Phys. Rev. B 73, 092504 (2006).), the 2D-XY critical dynamics for underdoped LSCO and the 3D-XY critical dynamics for optimally doped LSCO were reported. In this study, we observed a novel two-dimensional unknown critical charge dynamics for overdoped thin films from x=0.17 to 0.20, which is clearly distinguished from the 2D-XY critical dynamics. Through the systematic measurements by changing the film thickness or by applying small magnetic field, it was confirmed that this unusual behavior, which is referred as 2D-U below, was not induced by the finite size effect but was intrinsic to the overdoped LSCO. Thus, it was found that the critical behavior in the phase diagram of LSCO is classified into the following three types; (i) 2D-XY for underdoped region, (ii) 3D-XY for optimally doped region, and (iii) 2D-U for overdoped region. In other words, the dimensionality in the critical charge dynamics is changed twice with hole doping. We discuss possible origins of such anomalous dimensional crossovers with hole doping, including an interpretation based on the possible existence of a hidden quantum critical point near the optimally doped region.
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We present a high-resolution microwave spectrometer to measure the frequency-dependent complex conductivity of a superconducting thin film near the critical temperature. The instrument is based on a broadband measurement of the complex reflection coefficient, $S_{rm 11}$, of a coaxial transmission line, which is terminated to a thin film sample with the electrodes in a Corbino disk shape. In the vicinity of the critical temperature, the standard calibration technique using three known standards fails to extract the strong frequency dependence of the complex conductivity induced by the superconducting fluctuations. This is because a small unexpected difference between the phase parts of $S_{rm 11}$ for a short and load standards gives rise to a large error in the detailed frequency dependence of the complex conductivity near the superconducting transition. We demonstrate that a new calibration procedure using the normal-state conductivity of a sample as a load standard resolves this difficulty. The high quality performance of this spectrometer, which covers the frequency range between 0.1 GHz and 10 GHz, the temperature range down to 10 K, and the magnetic field range up to 1 T, is illustrated by the experimental results on several thin films of both conventional and high temperature superconductors.
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