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Register a new userSimulation of Scanning Near-Field Optical Microscopy Spectra of 1D Plasmonic Graphene Junctions
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Added by
Semenenko Vyacheslav L
Publication date
2021
fields
Physics
and research's language is
English
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We present numerical simulations of scattering-type Scanning Near-Field Optical Microscopy (s-SNOM) of 1D plasmonic graphene junctions. A comprehensive analysis of simulated s-SNOM spectra is performed for three types of junctions. We find conditions when the conventional interpretation of the plasmon reflection coefficients from s-SNOM measurements does not apply. Our results are applicable to other conducting 2D materials and provide a comprehensive understanding of the s-SNOM techniques for probing local transport properties of 2D materials.
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Time-resolved scanning Kerr microscopy (TRSKM) is a powerful technique for the investigation of picosecond magnetization dynamics at sub-micron length scales by means of the magneto-optical Kerr effect (MOKE). The spatial resolution of conventional (focused) Kerr microscopy using a microscope objective lens is determined by the optical diffraction limit so that the nanoscale character of the magnetization dynamics is lost. Here we present a platform to overcome this limitation by means of a near-field TRSKM that incorporates an atomic force microscope (AFM) with optical access to a metallic AFM probe with a nanoscale aperture at its tip. We demonstrate the near-field capability of the instrument through the comparison of time-resolved polar Kerr images of magnetization dynamics within a microscale NiFe rectangle acquired using both near-field and focused TRSKM techniques at a wavelength of 800 nm. The flux-closure domain state of the in-plane equilibrium magnetization provided the maximum possible dynamic polar Kerr contrast across the central domain wall, and enabled an assessment of the magneto-optical spatial resolution of each technique. Line profiles extracted from the Kerr images demonstrate that the near-field spatial resolution was enhanced with respect to that of the focused Kerr images. Furthermore, the near-field polar Kerr signal (~1 mdeg) was more than half that of the focused Kerr signal, despite the potential loss of probe light due to internal reflections within the AFM tip. We have confirmed the near-field operation by exploring the influence of the tip-sample separation, and have determined the spatial resolution to be ~550 nm for an aperture with a sub-wavelength diameter of 400 nm. The spatial resolution of the near-field TRSKM was in good agreement with finite element modelling of the aperture...
The graphene moire structures on metals, as they demonstrate both long (moire) and short (atomic) scale ordered structures, are the ideal systems for the application of scanning probe methods. Here we present the complex studies of the graphene/Ir(111) system by means of 3D scanning tunnelling and atomic force microscopy/spectroscopy as well as Kelvin-probe force microscopy. All results clearly demonstrate a variation of the moire and atomic scale contrasts as a function of the bias voltage as well as the distance between the scanning probe and the sample, allowing to discriminate between topographic and electronic contributions in the imaging of a graphene layer on metals. The presented results are accompanied by the state-of-the-art density functional theory calculations demonstrating the excellent agreement between theoretical and experimental data.
We develop a theory to study apertureless scanning near-field optical microscopy which takes into account retardation, higher multipoles of the tip, and the multiple scattering between the tip and the surface. We focus on metallic systems and discuss the implication of the formation of tip-induced surface plasmon modes in the tip-surface system. We discuss the effects associated with the shift in energy of those modes as a function of the tip-surface distance. Both the local field and the scattering cross section are enhanced when the tip approaches the surface, but there is no general correspondence between the two enhancements.
The finite-difference time-domain (FDTD) method is employed to solve the three dimensional Maxwell equation for the situation of near-field microscopy using a sub-wavelength aperture. Experimental result on unexpected high spatial resolution is reproduced by our computer simulation.
Moire superlattices in van der Waals heterostructures are gaining increasing attention because they offer new opportunities to tailor and explore unique electronic phenomena when stacking 2D materials with small twist angles. Here, we reveal local surface potentials associated with stacking domains in twisted double bilayer graphene (TDBG) moire superlattices. Using a combination of both lateral Piezoresponse Force Microscopy (LPFM) and Scanning Kelvin Probe Microscopy (SKPM), we distinguish between Bernal (ABAB) and rhombohedral (ABCA) stacked graphene and directly correlate these stacking configurations with local surface potential. We find that the surface potential of the ABCA domains is ~15 mV higher (smaller work function) than that of the ABAB domains. First-principles calculations based on density functional theory further show that the different work functions between ABCA and ABAB domains arise from the stacking dependent electronic structure. We show that, while the moire superlattice visualized by LPFM can change with time, imaging the surface potential distribution via SKPM appears more stable, enabling the mapping of ABAB and ABCA domains without tip-sample contact-induced effects. Our results provide a new means to visualize and probe local domain stacking in moire superlattices along with its impact on electronic properties.
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