No Arabic abstract
One of the main characteristics of optical imaging systems is the spatial resolution, which is restricted by the diffraction limit to approximately half the wavelength of the incident light. Along with the recently developed classical super-resolution techniques, which aim at breaking the diffraction limit in classical systems, there is a class of quantum super-resolution techniques which leverage the non-classical nature of the optical signals radiated by quantum emitters, the so-called antibunching super-resolution microscopy. This approach can ensure a factor of $sqrt{n}$ improvement in the spatial resolution by measuring the n-th order autocorrelation function. The main bottleneck of the antibunching super-resolution microscopy is the time-consuming acquisition of multi-photon event histograms. We present a machine learning-assisted approach for the realization of rapid antibunching super-resolution imaging and demonstrate 12 times speed-up compared to conventional, fitting-based autocorrelation measurements. The developed framework paves the way to the practical realization of scalable quantum super-resolution imaging devices that can be compatible with various types of quantum emitters.
Spatial resolution is one of the most important specifications of an imaging system. Recent results in quantum parameter estimation theory reveal that an arbitrarily small distance between two incoherent point sources can always be efficiently determined through the use of a spatial mode sorter. However, extending this procedure to a general object consisting of many incoherent point sources remains challenging, due to the intrinsic complexity of multi-parameter estimation problems. Here, we generalize the Richardson-Lucy (RL) deconvolution algorithm to address this challenge. We simulate its application to an incoherent confocal microscope, with a Zernike spatial mode sorter replacing the pinhole used in a conventional confocal microscope. We test different spatially incoherent objects of arbitrary geometry, and we find that the resolution enhancement of sorter-based microscopy is on average over 30% higher than that of a conventional confocal microscope using the standard RL deconvolution algorithm. Our method could potentially be used in diverse applications such as fluorescence microscopy and astronomical imaging.
Super-resolution imaging with advanced optical systems has been revolutionizing technical analysis in various fields from biological to physical sciences. However, many objects are hidden by strongly scattering media such as rough wall corners or biological tissues that scramble light paths, create speckle patterns and hinder objects visualization, let alone super-resolution imaging. Here, we realize a method to do non-invasive super-resolution imaging through scattering media based on stochastic optical scattering localization imaging (SOSLI) technique. Simply by capturing multiple speckle patterns of photo-switchable emitters in our demonstration, the stochastic approach utilizes the speckle correlation properties of scattering media to retrieve an image with more than five-fold resolution enhancement compared to the diffraction limit, while posing no fundamental limit in achieving higher spatial resolution. More importantly, we demonstrate our SOSLI to do non-invasive super-resolution imaging through not only optical diffusers, i.e. static scattering media, but also biological tissues, i.e. dynamic scattering media with decorrelation of up to 80%. Our approach paves the way to non-invasively visualize various samples behind scattering media at unprecedented levels of detail.
Super-resolution fluorescence microscopy is an important tool in biomedical research for its ability to discern features smaller than the diffraction limit. However, due to its difficult implementation and high cost, the universal application of super-resolution microscopy is not feasible. In this paper, we propose and demonstrate a new kind of super-resolution fluorescence microscopy that can be easily implemented and requires neither additional hardware nor complex post-processing. The microscopy is based on the principle of stepwise optical saturation (SOS), where $M$ steps of raw fluorescence images are linearly combined to generate an image with a $sqrt{M}$-fold increase in resolution compared with conventional diffraction-limited images. For example, linearly combining (scaling and subtracting) two images obtained at regular powers extends resolution by a factor of $1.4$ beyond the diffraction limit. The resolution improvement in SOS microscopy is theoretically infinite but practically is limited by the signal-to-noise ratio. We perform simulations and experimentally demonstrate super-resolution microscopy with both one-photon (confocal) and multiphoton excitation fluorescence. We show that with the multiphoton modality, the SOS microscopy can provide super-resolution imaging deep in scattering samples.
We demonstrate super-resolution imaging of single rare-earth emitting centers, namely, trivalent cerium, in yttrium aluminum garnet (YAG) crystals by means of stimulated emission depletion (STED) microscopy. The achieved all-optical resolution is $approx$ 80nm. Similar results were obtained on H3 color centers in diamond with resolution of $approx$ 60nm. In both cases, STED resolution is improving slower than the inverse square-root of the depletion beam intensity. This is caused by excited state absorption (ESA) and interaction of the emitter with non-fluorescing crystal defects in its near surrounding.
This work presents a new super-resolution imaging approach by using subwavelength hole resonances. We employ a subwavelength structure in which an array of tiny holes are etched in a metallic slab with the neighboring distance $ell$ that is smaller than half of the wavelength. By tuning the incident wave at resonant frequencies, the subwavelength structure generates strong illumination patterns that are able to probe both low and high spatial frequency components of the imaging sample sitting above the structure. The image of the sample is obtained by performing stable numerical reconstruction from the far-field measurement of the diffracted wave. It is demonstrated that a resolution of $ell/2$ can be obtained for reconstructed images, thus one can achieve super-resolution by arranging multiple holes within one wavelength. The proposed approach may find applications in wave-based imaging such as electromagnetic and ultrasound imaging. It attains two advantages that are important for practical realization. It avoids the difficulty to control the distance the between the probe and the sample surface with high precision. In addition, the numerical reconstructed images are very stable against noise by only using the low frequency band of the far-field data in the numerical reconstruction.