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Optimal Accelerated Degradation Testing Based on Bivariate Gamma Process with Dependent Components

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 Added by Helmi Shat
 Publication date 2021
and research's language is English




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Accelerated degradation testing (ADT) is one of the major approaches in reliability engineering which allows accurate estimation of reliability characteristics of highly reliable systems within a relatively short time. The testing data are extrapolated through a physically reasonable statistical model to obtain estimates of lifetime quantiles at normal use conditions. The Gamma process is a natural model for degradation, which exhibits a monotone and strictly increasing degradation path. In this work, optimal experimental designs are derived for ADT with two response components. We consider the situations of independent as well as dependent marginal responses where the observational times are assumed to be fixed and known. The marginal degradation paths are assumed to follow a Gamma process where a copula function is utilized to express the dependence between both components. For the case of independent response components the optimal design minimizes the asymptotic variance of an estimated quantile of the failure time distribution at the normal use conditions. For the case of dependent response components the $D$-criterion is adopted to derive $D$-optimal designs. Further, $D$- and $c$-optimal designs are developed when the copula-based models are reduced to bivariate binary outcomes.



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Accelerated degradation tests are used to provide accurate estimation of lifetime characteristics of highly reliable products within a relatively short testing time. Data from particular tests at high levels of stress (e.g., temperature, voltage, or vibration) are extrapolated, through a physically meaningful statistical model, to attain estimates of lifetime quantiles at normal use conditions. The gamma process is a natural model for estimating the degradation increments over certain degradation paths, which exhibit a monotone and strictly increasing degradation pattern. In this work, we derive first an algorithm-based optimal design for a repeated measures degradation test with single failure mode that corresponds to a single response component. The univariate degradation process is expressed using a gamma model where a generalized linear model is introduced to facilitate the derivation of an optimal design. Consequently, we extend the univariate model and characterize optimal designs for accelerated degradation tests with bivariate degradation processes. The first bivariate model includes two gamma processes as marginal degradation models. The second bivariate models is expressed by a gamma process along with a mixed effects linear model. We derive optimal designs for minimizing the asymptotic variance for estimating some quantile of the failure time distribution at the normal use conditions. Sensitivity analysis is conducted to study the behavior of the resulting optimal designs under misspecifications of adopted nominal values.
Accelerated degradation tests are used to provide accurate estimation of lifetime properties of highly reliable products within a relatively short testing time. There data from particular tests at high levels of stress (e.,g. temperature, voltage, or vibration) are extrapolated, through a physically meaningful model, to obtain estimates of lifetime quantiles under normal use conditions. In this work, we consider repeated measures accelerated degradation tests with multiple stress variables, where the degradation paths are assumed to follow a linear mixed effects model which is quite common in settings when repeated measures are made. We derive optimal experimental designs for minimizing the asymptotic variance for estimating the median failure time under normal use conditions when the time points for measurements are either fixed in advance or are also to be optimized.
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