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Register a new userAn application of a Si/CdTe Compton camera for the polarization measurement of hard x-rays from highly charged heavy ions
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The methods to measure the polarization of the x-rays from highly charged heavy ions with a significantly higher accuracy than the existing technology is needed to explore relativistic and quantum electrodynamics (QED) effects including the Breit interaction. We developed the Electron Beam Ion Trap Compton Camera (EBIT-CC), a new Compton polarimeter with pixelated multi-layer silicon and cadmium telluride counters. The EBIT-CC detects the three-dimensional position of Compton scattering and photoelectric absorption, and thus the degree of polarization of incoming x-rays can be evaluated. We attached the EBIT-CC on the Tokyo Electron Beam Ion Trap (Tokyo-EBIT) in the University of Electro-Communications. An experiment was performed to evaluate its polarimetric capability through an observation of radiative recombination x-rays emitted from highly charged krypton ions, which were generated by the Tokyo-EBIT. The Compton camera of the EBIT-CC was calibrated for the 75 keV x-rays. We developed event reconstruction and selection procedures and applied them to every registered event. As a result, we successfully obtained the polarization degree with an absolute uncertainty of 0.02. This uncertainty is small enough to probe the difference between the zero-frequency approximation and full-frequency-dependent calculation for the Breit interaction, which is expected for dielectronic recombination x-rays of highly charged heavy ions.
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A Compton camera is the most promising approach for gamma-ray detection in the energy region from several hundred keV to MeV, especially for application in high energy astrophysics. In order to obtain good angular resolution, semiconductor detectors such as silicon, germanium and cadmium telluride(CdTe) have several advantages over scintillation detectors, which have been used so far. Based on the recent advances of high resolution CdTe and silicon imaging detectors, we are working on a Si/CdTe Compton camera. We have developed 64-pixel CdTe detectors with a pixel size of 2mmx2mm and double-sided Si strip detectors(DSSDs) with a position resolution of 800 micron. As a prototype Si/CdTe Compton camera, we use a DSSD as a scatterer and two CdTe pixel detectors as an absorber. In order to verify its performance, we irradiate the camera with 100% linearly polarised 170keV gamma-rays and demonstrate the system works properly as a Compton camera. The resolution of the reconstructed scattering angle is 22 degrees(FWHM). Measurement of polarization is also reported. The polarimetric modulation factor is obtained to be 43%, which is consistent with the prediction of Monte Carlo simulations.
We report linear polarization measurements of x rays emitted due to dielectronic recombination into highly charged krypton ions. The ions in the He-like through O-like charge states were populated in an electron beam ion trap with the electron beam energy adjusted to recombination resonances in order to produce $Kalpha$ x rays. The x rays were detected with a newly developed Compton polarimeter using a beryllium scattering target and 12 silicon x-ray detector diodes sampling the azimuthal distribution of the scattered x rays. The extracted degrees of linear polarization of several dielectronic recombination transitions agree with results of relativistic distorted--wave calculations. We also demonstrate a high sensitivity of the polarization to the Breit interaction, which is remarkable for a medium-$Z$ element like krypton. The experimental results can be used for polarization diagnostics of hot astrophysical and laboratory fusion plasmas.
Radiation from the highly-charged ions contained in the plasma of Electron-Cyclotron Resonance Ion Sources constitutes a very bright source of X-rays. Because the ions have a relatively low kinetic energy ($approx 1$ eV) transitions can be very narrow, containing only small Doppler broadening. We describe preliminary accurate measurements of two and three-electron ions with Z=16--18. We show how these measurement can test sensitively many-body relativistic calculations or can be used as X-ray standards for precise measurements of X-ray transitions in exotic atoms.
Gamma-ray polarization offers a unique probes into the geometry of the gamma-ray emission process in celestial objects. The Soft Gamma-ray Detector (SGD) onboard the X-ray observatory Hitomi is a Si/CdTe Compton camera and is expected to be an excellent polarimeter, as well as a highly sensitive spectrometer due to its good angular coverage and resolution for Compton scattering. A beam test of the final-prototype for the SGD Compton camera was conducted to demonstrate its polarimetric capability and to verify and calibrate the Monte Carlo simulation of the instrument. The modulation factor of the SGD prototype camera, evaluated for the inner and outer parts of the CdTe sensors as absorbers, was measured to be 0.649--0.701 (inner part) and 0.637--0.653 (outer part) at 122.2 keV and 0.610--0.651 (inner part) and 0.564--0.592 (outer part) at 194.5 keV at varying polarization angles with respect to the detector. This indicates that the relative systematic uncertainty of the modulation factor is as small as ~3%.
An overview and status report of the new trapping facility for highly charged ions at the Gesellschaft fuer Schwerionenforschung is presented. The construction of this facility started in 2005 and is expected to be completed in 2008. Once operational, highly charged ions will be loaded from the experimental storage ring ESR into the HITRAP facility, where they are decelerated and cooled. The kinetic energy of the initially fast ions is reduced by more than fourteen orders of magnitude and their thermal energy is cooled to cryogenic temperatures. The cold ions are then delivered to a broad range of atomic physics experiments.
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