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Register a new userQuality Assurance Test of Silicon Photomultipliers and Electronic Boards for STAR Event Plane Detector
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The event plane detector (EPD), installed in the Solenoid Tracker at the Relativistic Heavy-Ion Collider located at the Brookhaven National Laboratory is a plastic scintillator-based device that measures the reaction centrality and event plane in the forward region of the relativistic heavy-ion collisions. We used silicon photomultiplier (SiPM) arrays to detect the photons produced in the scintillator via the fiber connection. Signals from the SiPM arrays were amplified by the front-end electronic (FEE) board, and sent to the analog-to-digital converter (ADC) boards for further processing via the receiver(RX) board. The full EPD system consisted of 24 super-sectors (SSs); each SS was equipped with two SiPM boards, two FEE boards and two RX boards, and they corresponded to 744 readout channels. All these boards were mass produced at the University of Science and Technology of China, with a dedicated quality assurance (QA) procedures applied to identify any problems before deployment. This article describes the details of the QA method and the related test system. The QA test results are presented along with the discussions.
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The Mu2e electromagnetic calorimeter has to provide precise information on energy, time and position for $sim$100 MeV electrons. It is composed of 1348 un-doped CsI crystals, each coupled to two large area Silicon Photomultipliers (SiPMs). A modular and custom SiPM layout consisting of a 3$times$2 array of 6$times$6 mm$^2$ UV-extended monolithic SiPMs has been developed to fulfill the Mu2e calorimeter requirements and a pre-production of 150 prototypes has been procured by three international firms (Hamamatsu, SensL and Advansid). A detailed quality assurance process has been carried out on this first batch of photosensors: the breakdown voltage, the gain, the quenching time, the dark current and the Photon Detection Efficiency (PDE) have been determined for each monolithic cell of each SiPMs array. One sample for each vendor has been exposed to a neutron fluency up to $sim$8.5~$times$~10$^{11}$ 1 MeV (Si) eq. n/cm$^{2}$ and a linear increase of the dark current up to tens of mA has been observed. Others 5 samples for each vendor have undergone an accelerated aging in order to verify a Mean Time To Failure (MTTF) higher than $sim$10$^{6}$ hours.
Silicon Photomultipliers (SiPMs) are attractive candidates for light detectors for next generation liquid xenon double-beta decay experiments, like nEXO. In this paper we discuss the requirements that the SiPMs must satisfy in order to be suitable for nEXO and similar experiments, describe the two test setups operated by the nEXO collaboration, and present the results of characterization of SiPMs from several vendors. In particular, we find that the photon detection efficiency at the peak of xenon scintillation light emission (175-178 nm) approaches the nEXO requirements for tested FBK and Hamamatsu devices. Additionally, the nEXO collaboration performed radioassay of several grams of bare FBK devices using neutron activation analysis, indicating levels of 40K, 232Th, and 238U of the order of <0.15, (6.9e10-4 - 1.3e10-2), and <0.11 mBq/kg, respectively.
The results obtained in laboratory tests, using scintillator bars read by silicon photomultipliers are reported. The present approach is the first step for designing a precision tracking system to be placed inside a free magnetized volume for the charge identification of low energy crossing particles. The devised system is demonstrated able to provide a spatial resolution better than 2 mm.
An analysis software was developed for the high aspect ratio optical scanning system in the Detec- tor Laboratory of the University of Helsinki and the Helsinki Institute of Physics. The system is used e.g. in the quality assurance of the GEM-TPC detectors being developed for the beam diagnostics system of the SuperFRS at future FAIR facility. The software was tested by analyzing five CERN standard GEM foils scanned with the optical scanning system. The measurement uncertainty of the diameter of the GEM holes and the pitch of the hole pattern was found to be 0.5 {mu}m and 0.3 {mu}m, respectively. The software design and the performance are discussed. The correlation between the GEM hole size distribution and the corresponding gain variation was studied by comparing them against a detailed gain mapping of a foil and a set of six lower precision control measurements. It can be seen that a qualitative estimation of the behavior of the local variation in gain across the GEM foil can be made based on the measured sizes of the outer and inner holes.
This paper describes an experimental setup that has been developed to measure and characterise properties of Silicon Photomultipliers (SiPM). The measured SiPM properties are of general interest for a multitude of potential applications and comprise the Photon Detection Efficiency (PDE), the voltage dependent cross-talk and the after-pulse probabilities. With the described setup the absolute PDE can be determined as a function of wavelength covering a spectral range from 350 to 1000nm. In addition, a method is presented which allows to study the pixel uniformity in terms of the spatial variations of sensitivity and gain. The results from various commercially available SiPMs - three HAMAMATSU MPPCs and one SensL SPM - are presented and compared.
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