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Register a new userMachine learning and high-throughput robust design of P3HT-CNT composite thin films for high electrical conductivity
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Added by
Kedar Hippalgaonkar
Publication date
2020
fields
Physics
and research's language is
English
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Combining high-throughput experiments with machine learning allows quick optimization of parameter spaces towards achieving target properties. In this study, we demonstrate that machine learning, combined with multi-labeled datasets, can additionally be used for scientific understanding and hypothesis testing. We introduce an automated flow system with high-throughput drop-casting for thin film preparation, followed by fast characterization of optical and electrical properties, with the capability to complete one cycle of learning of fully labeled ~160 samples in a single day. We combine regio-regular poly-3-hexylthiophene with various carbon nanotubes to achieve electrical conductivities as high as 1200 S/cm. Interestingly, a non-intuitive local optimum emerges when 10% of double-walled carbon nanotubes are added with long single wall carbon nanotubes, where the conductivity is seen to be as high as 700 S/cm, which we subsequently explain with high fidelity optical characterization. Employing dataset resampling strategies and graph-based regressions allows us to account for experimental cost and uncertainty estimation of correlated multi-outputs, and supports the proving of the hypothesis linking charge delocalization to electrical conductivity. We therefore present a robust machine-learning driven high-throughput experimental scheme that can be applied to optimize and understand properties of composites, or hybrid organic-inorganic materials.
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Accelerating the experimental cycle for new materials development is vital for addressing the grand energy challenges of the 21st century. We fabricate and characterize 75 unique halide perovskite-inspired solution-based thin-film materials within a two-month period, with 87% exhibiting band gaps between 1.2 eV and 2.4 eV that are of interest for energy-harvesting applications. This increased throughput is enabled by streamlining experimental workflows, developing a set of precursors amenable to high-throughput synthesis, and developing machine-learning assisted diagnosis. We utilize a deep neural network to classify compounds based on experimental X-ray diffraction data into 0D, 2D, and 3D structures more than 10 times faster than human analysis and with 90% accuracy. We validate our methods using lead-halide perovskites and extend the application to novel lead-free compositions. The wider synthesis window and faster cycle of learning enables three noteworthy scientific findings: (1) we realize four inorganic layered perovskites, A3B2Br9 (A = Cs, Rb; B = Bi, Sb) in thin-film form via one-step liquid deposition; (2) we report a multi-site lead-free alloy series that was not previously described in literature, Cs3(Bi1-xSbx)2(I1-xBrx)9; and (3) we reveal the effect on bandgap (reduction to <2 eV) and structure upon simultaneous alloying on the B-site and X-site of Cs3Bi2I9 with Sb and Br. This study demonstrates that combining an accelerated experimental cycle of learning and machine-learning based diagnosis represents an important step toward realizing fully-automated laboratories for materials discovery and development.
High throughput experimental methods are known to accelerate the rate of research, development, and deployment of electronic materials. For example, thin films with lateral gradients in composition, thickness, or other parameters have been used alongside spatially-resolved characterization to assess how various physical factors affect material properties under varying measurement conditions. Similarly, multi-layer electronic devices that contain such graded thin films as one or more of their layers can also be characterized spatially in order to optimize the performance. In this work, we apply these high throughput experimental methods to thin film transistors (TFTs), demonstrating combinatorial device fabrication and semi-automated characterization using sputtered Indium-Gallium-Zinc-Oxide (IGZO) TFTs as a case study. We show that both extrinsic and intrinsic types of device gradients can be generated in a TFT library, such as channel thickness and length, channel cation compositions, and oxygen atmosphere during deposition. We also present a semi-automated method to measure the 44 devices fabricated on a 50x50mm substrate that can help to identify properly functioning TFTs in the library and finish the measurement in a short time. Finally, we propose a fully automated characterization system for similar TFT libraries, which can be coupled with high throughput data analysis. These results demonstrate that high throughput methods can accelerate the investigation of TFTs and other electronic devices.
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