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Register a new userData-Driven Open Set Fault Classification and Fault Size Estimation Using Quantitative Fault Diagnosis Analysis
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Data-driven fault classification is complicated by imbalanced training data and unknown fault classes. Fault diagnosis of dynamic systems is done by detecting changes in time-series data, for example residuals, caused by faults or system degradation. Different fault classes can result in similar residual outputs, especially for small faults which can be difficult to distinguish from nominal system operation. Analyzing how easy it is to distinguish data from different fault classes is crucial during the design process of a diagnosis system to evaluate if classification performance requirements can be met. Here, a data-driven model of different fault classes is used based on the Kullback-Leibler divergence. This is used to develop a framework for quantitative fault diagnosis performance analysis and open set fault classification. A data-driven fault classification algorithm is proposed which can handle unknown faults and also estimate the fault size using training data from known fault scenarios. To illustrate the usefulness of the proposed methods, data have been collected from an engine test bench to illustrate the design process of a data-driven diagnosis system, including quantitative fault diagnosis analysis and evaluation of the developed open set fault classification algorithm.
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The scope of data-driven fault diagnosis models is greatly improved through deep learning (DL). However, the classical convolution and recurrent structure have their defects in computational efficiency and feature representation, while the latest Transformer architecture based on attention mechanism has not been applied in this field. To solve these problems, we propose a novel time-frequency Transformer (TFT) model inspired by the massive success of standard Transformer in sequence processing. Specially, we design a fresh tokenizer and encoder module to extract effective abstractions from the time-frequency representation (TFR) of vibration signals. On this basis, a new end-to-end fault diagnosis framework based on time-frequency Transformer is presented in this paper. Through the case studies on bearing experimental datasets, we constructed the optimal Transformer structure and verified the performance of the diagnostic method. The superiority of the proposed method is demonstrated in comparison with the benchmark model and other state-of-the-art methods.
Recent progress on intelligent fault diagnosis has greatly depended on the deep learning and plenty of labeled data. However, the machine often operates with various working conditions or the target task has different distributions with the collected data used for training (we called the domain shift problem). This leads to the deep transfer learning based (DTL-based) intelligent fault diagnosis which attempts to remit this domain shift problem. Besides, the newly collected testing data are usually unlabeled, which results in the subclass DTL-based methods called unsupervised deep transfer learning based (UDTL-based) intelligent fault diagnosis. Although it has achieved huge development in the field of fault diagnosis, a standard and open source code framework and a comparative study for UDTL-based intelligent fault diagnosis are not yet established. In this paper, commonly used UDTL-based algorithms in intelligent fault diagnosis are integrated into a unified testing framework and the framework is tested on five datasets. Extensive experiments are performed to provide a systematically comparative analysis and the benchmark accuracy for more comparable and meaningful further studies. To emphasize the importance and reproducibility of UDTL-based intelligent fault diagnosis, the testing framework with source codes will be released to the research community to facilitate future research. Finally, comparative analysis of results also reveals some open and essential issues in DTL for intelligent fault diagnosis which are rarely studied including transferability of features, influence of backbones, negative transfer, and physical priors. In summary, the released framework and comparative study can serve as an extended interface and the benchmark results to carry out new studies on UDTL-based intelligent fault diagnosis. The code framework is available at https://github.com/ZhaoZhibin/UDTL.
This paper presents an eXplainable Fault Detection and Diagnosis System (XFDDS) for incipient faults in PV panels. The XFDDS is a hybrid approach that combines the model-based and data-driven framework. Model-based FDD for PV panels lacks high fidelity models at low irradiance conditions for detecting incipient faults. To overcome this, a novel irradiance based three diode model (IB3DM) is proposed. It is a nine parameter model that provides higher accuracy even at low irradiance conditions, an important aspect for detecting incipient faults from noise. To exploit PV data, extreme gradient boosting (XGBoost) is used due to its ability to detecting incipient faults. Lack of explainability, feature variability for sample instances, and false alarms are challenges with data-driven FDD methods. These shortcomings are overcome by hybridization of XGBoost and IB3DM, and using eXplainable Artificial Intelligence (XAI) techniques. To combine the XGBoost and IB3DM, a fault-signature metric is proposed that helps reducing false alarms and also trigger an explanation on detecting incipient faults. To provide explainability, an eXplainable Artificial Intelligence (XAI) application is developed. It uses the local interpretable model-agnostic explanations (LIME) framework and provides explanations on classifier outputs for data instances. These explanations help field engineers/technicians for performing troubleshooting and maintenance operations. The proposed XFDDS is illustrated using experiments on different PV technologies and our results demonstrate the perceived benefits.
This paper presents a new state space generation approach for dynamic fault trees (DFTs) together with a technique to synthesise failures rates in DFTs. Our state space generation technique aggressively exploits the DFT structure --- detecting symmetries, spurious non-determinism, and dont cares. Benchmarks show a gain of more than two orders of magnitude in terms of state space generation and analysis time. Our approach supports DFTs with symbolic failure rates and is complemented by parameter synthesis. This enables determining the maximal tolerable failure rate of a system component while ensuring that the mean time of failure stays below a threshold.
We report on the development of machine learning models for classifying C100 superconducting radio-frequency (SRF) cavity faults in the Continuous Electron Beam Accelerator Facility (CEBAF) at Jefferson Lab. CEBAF is a continuous-wave recirculating linac utilizing 418 SRF cavities to accelerate electrons up to 12 GeV through 5-passes. Of these, 96 cavities (12 cryomodules) are designed with a digital low-level RF system configured such that a cavity fault triggers waveform recordings of 17 RF signals for each of the 8 cavities in the cryomodule. Subject matter experts (SME) are able to analyze the collected time-series data and identify which of the eight cavities faulted first and classify the type of fault. This information is used to find trends and strategically deploy mitigations to problematic cryomodules. However manually labeling the data is laborious and time-consuming. By leveraging machine learning, near real-time (rather than post-mortem) identification of the offending cavity and classification of the fault type has been implemented. We discuss performance of the ML models during a recent physics run. Results show the cavity identification and fault classification models have accuracies of 84.9% and 78.2%, respectively.
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