Subscribe to the gold package and get unlimited access to Shamra Academy
Register a new userExtreme sensitivity refractive index sensor based on lithography-free metal-dielectric cavity
99
0
0.0
(
0
)
Ask ChatGPT about the research
No Arabic abstract
The use of relatively simple structures to achieve high performance refractive index sensors has always been urgently needed. In this work, we propose a lithography-free sensing platform based on metal-dielectric cavity, the sensitivity of our device can reach 1456700 nm/RIU for solution and 1596700 nm/RIU for solid material, and the FOM can be up to 1234500 /RIU for solution and 1900800 /RIU for solid material, which both are much higher than most sensing methods. This sensor has excellent sensing performance in both TE and TM light, and suitable for integrated microfluidic channels. Our scheme uses a multi-layers structure with a 10 nm gold film sandwiched between prism and analyte, and shows a great potential for low-cost sensing with high performance.
rate research
Read More
A refractive index sensor based on a semicircular bent fiber is presented. The interference occurs between the cladding mode excited in the bending region and the core mode. Both the theoretical and experimental results show that the resonant dip wavelength decreases linearly with the increase of the refractive index of the surrounding environment. A high sensitivity of 1031 nm per refractive index unit is obtained over the refractive index range of 1.3324 to 1.3435 by using a bent fiber with a bending radius of 500 {mu}m.
We present broadband cavity-enhanced complex refractive index spectroscopy (CE-CRIS), a technique for calibration-free determination of the complex refractive index of entire molecular bands via direct measurement of transmission modes of a Fabry-Perot cavity filled with the sample. The measurement of the cavity transmission spectrum is done using an optical frequency comb and a mechanical Fourier transform spectrometer with sub-nominal resolution. Molecular absorption and dispersion spectra (corresponding to the imaginary and real parts of the refractive index) are obtained from the cavity mode broadening and shift retrieved from fits of Lorentzian profiles to the individual cavity modes. This method is calibration-free because the mode broadening and shift are independent of the cavity parameters such as the length and mirror reflectivity. In this first demonstration of broadband CE-CRIS we measure simultaneously the absorption and dispersion spectra of three combination bands of CO2 in the range between 1525 nm and 1620 nm and achieve good agreement with theoretical models. This opens up for precision spectroscopy of the complex refractive index of several molecular bands simultaneously.
The article demonstrates uncommon manifestation of spatial dispersion in low refractive index contrast 3D periodic dielectric composites with periods of about one tenth of the wavelength. First principles simulations by the well established plane wave method reveal that spatial dispersion leads to appearance of additional optical axes and can compensate anisotropy in certain directions.
Which systems are ideal to obtain negative refraction with no absorption? Electromagnetically induced transparency (EIT) is a method to suppress absorption and make a material transparent to a field of a given frequency. Such a system has been discussed in [1]; however the main limitations for negative refraction introduced are the necessity of resonant electric and magnetic dipole transitions, and the necessity of very dense media. We suggest using frequency translators in a composite system that would provide negative refraction for a range of optical frequencies while attempting to overcome the limitations discussed above. In the process of using frequency translators, we also find composite systems that can be used for refractive index enhancement.
In this research, we report the experimental evidence of the directional Fano resonances at the scattering of a plane, linearly polarized electromagnetic wave by a homogeneous dielectric sphere with high refractive index and low losses. We observe a typical asymmetric Fano profile for the intensity scattered in, practically, any given direction, while the overall extinction cross section remains Lorentzian. The phenomenon is originated in the interference of the selectively excited electric dipolar and quadrupolar modes. The selectivity of the excitation is achieved by the proper choice of the frequency of the incident wave. Thanks to the scaling invariance of the Maxwell equations, in these experiments we mimic the scattering of the visible and near IR radiation by a nanoparticle made of common superconductor materials (Si, Ge, GaAs, GaP) by the equivalent scattering of a spherical particle of 18 mm in diameter in the microwave range. The theory developed to explain the experiments extends the conventional Fano approach to the case when both interfering partitions are resonant. The perfect agreement between the experiment and the theory is demonstrated.
Log in to be able to interact and post comments
comments
Fetching comments
Sign in to be able to follow your search criteria
