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Register a new userTunneling interferometry and measurement of thickness of ultrathin metallic Pb(111) films
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Added by
Alexei Yu. Aladyshkin
Publication date
2019
fields
Physics
and research's language is
English
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Spectra of the differential tunneling conductivity for ultrathin lead films grown on Si(111)7x7 single crystals with a thickness from 9 to 50 monolayers have been studied by low-temperature scanning tunneling microscopy and spectroscopy. The presence of local maxima of the tunneling conductivity is typical for such systems. The energies of maxima of the differential conductivity are determined by the spectrum of quantum-confined states of electrons in a metallic layer and, consequently, the local thickness of the layer. It has been shown that features of the microstructure of substrates, such as steps of monatomic height, structural defects, and inclusions of other materials covered with a lead layer, can be visualized by bias-modulation scanning tunneling spectroscopy.
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The spatial distribution of the differential conductance for ultrathin Pb films grown on Si(111)7x7 substrate is studied by means of low-temperature scanning tunneling microscopy and spectroscopy. The formation of the quantum--confined states for conduction electrons and, correspondingly, the appearance of local maxima of the differential tunneling conductance are typical for Pb films; the energy of such states is determined mainly by the local thickness of Pb film. We demonstrate that the magnitude of the tunneling conductivity within atomically flat terraces can be spatially nonuniform and the period of the small-scale modulation coincides with the period of Si(111)7x7 reconstruction. For relatively thick Pb films we observe large-scale inhomogeneities of the tunneling conductance, which reveal itself as a gradual shift of the quantized levels at a value of the order of 50 meV at distances of the order of 100 nm. We believe that such large-scale variations of the tunneling conductance and, respectively, local density of states in Pb films can be related to presence of internal defects of crystalline structure, for instance, local electrical potentials and stresses.
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