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Register a new userRevisiting Local Descriptor based Image-to-Class Measure for Few-shot Learning
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Wenbin Li
Publication date
2019
fields
Informatics Engineering
and research's language is
English
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Few-shot learning in image classification aims to learn a classifier to classify images when only few training examples are available for each class. Recent work has achieved promising classification performance, where an image-level feature based measure is usually used. In this paper, we argue that a measure at such a level may not be effective enough in light of the scarcity of examples in few-shot learning. Instead, we think a local descriptor based image-to-class measure should be taken, inspired by its surprising success in the heydays of local invariant features. Specifically, building upon the recent episodic training mechanism, we propose a Deep Nearest Neighbor Neural Network (DN4 in short) and train it in an end-to-end manner. Its key difference from the literature is the replacement of the image-level feature based measure in the final layer by a local descriptor based image-to-class measure. This measure is conducted online via a $k$-nearest neighbor search over the deep local descriptors of convolutional feature maps. The proposed DN4 not only learns the optimal deep local descriptors for the image-to-class measure, but also utilizes the higher efficiency of such a measure in the case of example scarcity, thanks to the exchangeability of visual patterns across the images in the same class. Our work leads to a simple, effective, and computationally efficient framework for few-shot learning. Experimental study on benchmark datasets consistently shows its superiority over the related state-of-the-art, with the largest absolute improvement of $17%$ over the next best. The source code can be available from UrlFont{https://github.com/WenbinLee/DN4.git}.
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Few-shot classification studies the problem of quickly adapting a deep learner to understanding novel classes based on few support images. In this context, recent research efforts have been aimed at designing more and more complex classifiers that measure similarities between query and support images, but left the importance of feature embeddings seldom explored. We show that the reliance on sophisticated classifier is not necessary and a simple classifier applied directly to improved feature embeddings can outperform state-of-the-art methods. To this end, we present a new method named textbf{DCAP} in which we investigate how one can improve the quality of embeddings by leveraging textbf{D}ense textbf{C}lassification and textbf{A}ttentive textbf{P}ooling. Specifically, we propose to pre-train a learner on base classes with abundant samples to solve dense classification problem first and then fine-tune the learner on a bunch of randomly sampled few-shot tasks to adapt it to few-shot scenerio or the test time scenerio. We suggest to pool feature maps by applying attentive pooling instead of the widely used global average pooling (GAP) to prepare embeddings for few-shot classification during meta-finetuning. Attentive pooling learns to reweight local descriptors, explaining what the learner is looking for as evidence for decision making. Experiments on two benchmark datasets show the proposed method to be superior in multiple few-shot settings while being simpler and more explainable. Code is available at: url{https://github.com/Ukeyboard/dcap/}.
The core idea of metric-based few-shot image classification is to directly measure the relations between query images and support classes to learn transferable feature embeddings. Previous work mainly focuses on image-level feature representations, which actually cannot effectively estimate a classs distribution due to the scarcity of samples. Some recent work shows that local descriptor based representations can achieve richer representations than image-level based representations. However, such works are still based on a less effective instance-level metric, especially a symmetric metric, to measure the relations between query images and support classes. Given the natural asymmetric relation between a query image and a support class, we argue that an asymmetric measure is more suitable for metric-based few-shot learning. To that end, we propose a novel Asymmetric Distribution Measure (ADM) network for few-shot learning by calculating a joint local and global asymmetric measure between two multivariate local distributions of queries and classes. Moreover, a task-aware Contrastive Measure Strategy (CMS) is proposed to further enhance the measure function. On popular miniImageNet and tieredImageNet, we achieve $3.02%$ and $1.56%$ gains over the state-of-the-art method on the $5$-way $1$-shot task, respectively, validating our innovative design of asymmetric distribution measures for few-shot learning.
The ability to incrementally learn new classes is crucial to the development of real-world artificial intelligence systems. In this paper, we focus on a challenging but practical few-shot class-incremental learning (FSCIL) problem. FSCIL requires CNN models to incrementally learn new classes from very few labelled samples, without forgetting the previously learned ones. To address this problem, we represent the knowledge using a neural gas (NG) network, which can learn and preserve the topology of the feature manifold formed by different classes. On this basis, we propose the TOpology-Preserving knowledge InCrementer (TOPIC) framework. TOPIC mitigates the forgetting of the old classes by stabilizing NGs topology and improves the representation learning for few-shot new classes by growing and adapting NG to new training samples. Comprehensive experimental results demonstrate that our proposed method significantly outperforms other state-of-the-art class-incremental learning methods on CIFAR100, miniImageNet, and CUB200 datasets.
Few-shot learning aims to recognize new categories using very few labeled samples. Although few-shot learning has witnessed promising development in recent years, most existing methods adopt an average operation to calculate prototypes, thus limited by the outlier samples. In this work, we propose a simple yet effective framework for few-shot classification, which can learn to generate preferable prototypes from few support data, with the help of an episodic prototype generator module. The generated prototype is meant to be close to a certain textit{targetproto{}} and is less influenced by outlier samples. Extensive experiments demonstrate the effectiveness of this module, and our approach gets a significant raise over baseline models, and get a competitive result compared to previous methods on textit{mini}ImageNet, textit{tiered}ImageNet, and cross-domain (textit{mini}ImageNet $rightarrow$ CUB-200-2011) datasets.
Metric learning is a widely used method for few shot learning in which the quality of prototypes plays a key role in the algorithm. In this paper we propose the trainable prototypes for distance measure instead of the artificial ones within the meta-training and task-training framework. Also to avoid the disadvantages that the episodic meta-training brought, we adopt non-episodic meta-training based on self-supervised learning. Overall we solve the few-shot tasks in two phases: meta-training a transferable feature extractor via self-supervised learning and training the prototypes for metric classification. In addition, the simple attention mechanism is used in both meta-training and task-training. Our method achieves state-of-the-art performance in a variety of established few-shot tasks on the standard few-shot visual classification dataset, with about 20% increase compared to the available unsupervised few-shot learning methods.
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