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Register a new user3D nano-bridge-based SQUID susceptometers for scanning magnetic imaging of quantum materials
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We designed and fabricated a new type of superconducting quantum interference device (SQUID) susceptometers for magnetic imaging of quantum materials. The 2-junction SQUID sensors employ 3D Nb nano-bridges fabricated using electron beam lithography. The two counter-wound balanced pickup loops of the SQUID enable gradiometric measurement and they are surrounded by a one-turn field coil for susceptibility measurements. The smallest pickup loop of the SQUIDs were 1 ${mu}m$ in diameter and the flux noise was around 1 $mu{Phi}_0/sqrt{Hz}$ at 100 Hz. We demonstrate scanning magnetometry, susceptometry and current magnetometry on some test samples using these nano-SQUIDs.
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Scanning superconducting quantum interference device (SQUID) microscopy is a magnetic imaging technique combining high-field sensitivity with nanometer-scale spatial resolution. State-of-the-art SQUID-on-tip probes are now playing an important role in mapping correlation phenomena, such as superconductivity and magnetism, which have recently been observed in two-dimensional van der Waals materials. Here, we demonstrate a scanning probe that combines the magnetic and thermal imaging provided by an on-tip SQUID with the tip-sample distance control and topographic contrast of a non-contact atomic force microscope (AFM). We pattern the nanometer-scale SQUID, including its weak-link Josephson junctions, via focused ion beam milling at the apex of a cantilever coated with Nb, yielding a sensor with an effective diameter of 365 nm, field sensitivity of 9.5 $text{nT}/sqrt{text{Hz}}$ and thermal sensitivity of 620 $text{nK}/sqrt{text{Hz}}$, operating in magnetic fields up to 1.0 T. The resulting SQUID-on-lever is a robust AFM-like scanning probe that expands the reach of sensitive nanometer-scale magnetic and thermal imaging beyond what is currently possible.
Superconducting QUantum Interference Device (SQUID) microscopy has excellent magnetic field sensitivity, but suffers from modest spatial resolution when compared with other scanning probes. This spatial resolution is determined by both the size of the field sensitive area and the spacing between this area and the sample surface. In this paper we describe scanning SQUID susceptometers that achieve sub-micron spatial resolution while retaining a white noise floor flux sensitivity of $approx 2muPhi_0/Hz^{1/2}$. This high spatial resolution is accomplished by deep sub-micron feature sizes, well shielded pickup loops fabricated using a planarized process, and a deep etch step that minimizes the spacing between the sample surface and the SQUID pickup loop. We describe the design, modeling, fabrication, and testing of these sensors. Although sub-micron spatial resolution has been achieved previously in scanning SQUID sensors, our sensors not only achieve high spatial resolution, but also have integrated modulation coils for flux feedback, integrated field coils for susceptibility measurements, and batch processing. They are therefore a generally applicable tool for imaging sample magnetization, currents, and susceptibilities with higher spatial resolution than previous susceptometers.
We present a combined scanning force and tunneling microscope working in a dilution refrigerator that is optimized for the study of individual electronic nano-devices. This apparatus is equipped with commercial piezo-electric positioners enabling the displacement of a sample below the probe over several hundred microns at very low temperature, without excessive heating. Atomic force microscopy based on a tuning fork resonator probe is used for cryogenic precise alignment of the tip with an individual device. We demonstrate the local tunneling spectroscopy of a hybrid Josephson junction as a function of its current bias.
We study voltage response of nano-bridge based DC-SQUID fabricated on a Si_{3}N_{4} membrane. Such a configuration may help in reducing 1/f noise, which originates from substrate fluctuating defects. We find that the poor thermal coupling between the DC-SQUID and the substrate leads to strong hysteretic response of the SQUID, even though it is biased by an alternating current. In addition, when the DC-SQUID is biased near a threshold of spontaneous oscillations, the measured voltage has an intermittent pattern, which depends on the applied magnetic flux through the SQUID.
Scanning nanoscale superconducting quantum interference devices (SQUIDs) are gaining interest as highly sensitive microscopic magnetic and thermal characterization tools of quantum and topological states of matter and devices. Here we introduce a novel technique of collimated differential-pressure magnetron sputtering for versatile self aligned fabrication of SQUID on tip (SOT) nanodevices, which cannot be produced by conventional sputtering methods due to their diffusive, rather than the required directional point-source, deposition. The new technique provides access to a broad range of superconducting materials and alloys beyond the elemental superconductors employed in the existing thermal deposition methods, opening the route to greatly enhanced SOT characteristics and functionalities. Utilizing this method, we have developed MoRe SOT devices with sub-50 nm diameter, magnetic flux sensitivity of 1.2 $muPhi_0/Hz^{1/2}$ up to 3 T at 4.2 K, and thermal sensitivity better than 4 $mu K/Hz^{1/2}$ up to 5 T, about five times higher than any previous report, paving the way to nanoscale imaging of magnetic and spintronic phenomena and of dissipation mechanisms in previously inaccessible quantum states of matter.
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