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Register a new userHalf-life measurement of 65Ga with gamma-spectroscopy
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The literature half-life value of 65Ga is based on only one experiment carried out more than 60 years ago and it has a relatively large uncertainty. In the present work this half-life is determined based on the counting of the gamma-rays following the beta-decay of 65Ga. Our new recommended half-life is 15.133 +- 0.028 min which is in agreement with the literature value but almost one order of magnitude more precise.
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The precise knowledge of the half-life of the reaction product is of crucial importance for a nuclear reaction cross section measurement carried out with the activation technique. The cross section of the $^{92}$Mo($alpha$,n)$^{95}$Ru reaction was measured recently using this experimental approach. The preliminary results indicated that the literature half-life of $^{95}$Ru, derived about half a century ago, is overestimated. Therefore, the half-lives of $^{95}$Ru and its daughter isotope $^{95}$Tc and $^{95m}$Tc have been measured with high precision using $gamma$-spectroscopy. The results are t$_{1/2}$=1.6033 $pm$ 0.0044 h for $^{95}$Ru, t$_{1/2}$ = 19.258 $pm$ 0.026 h for $^{95}$Tc and t$_{1/2}$ = 61.96 $pm$ 0.24 d for $^{95m}$Tc. The precision of the half-life values has been increased, consequently the recently measured $^{92}$Mo($alpha$,n)$^{95}$Ru activation cross section will become more precise.
The half-life of the $^{20}$F ground state has been measured using a radioactive beam implanted in a plastic scintillator and recording $betagamma$ coincidences together with four CsI(Na) detectors. The result, $T_{1/2} = 11.0011(69)_{rm stat}(30)_{rm sys}$~s, is at variance by 17 combined standard deviations with the two most precise results. The present value revives the poor consistency of results for this half-life and calls for a new measurement, with a technique having different sources of systematic effects, to clarify the discrepancy.
Rare event physics demands very detailed background control, high-performance detectors, and custom analysis strategies. Cryogenic calorimeters combine all these ingredients very effectively, representing a promising tool for next-generation experiments. CUPID-0 is one of the most advanced examples of such a technique, having demonstrated its potential with several results obtained with limited exposure. In this paper, we present a further application. Exploiting the analysis of delayed coincidence, we can identify the signals caused by the $^{220}$Rn-$^{216}$Po decay sequence on an event-by-event basis. The analysis of these events allows us to extract the time differences between the two decays, leading to a new evaluation of $^{216}$ half-life, estimated as (143.3 $pm$ 2.8) ms.
The beta-decay half-life of 26Si was measured with a relative precision of 1.4*10e3. The measurement yields a value of 2.2283(27) s which is in good agreement with previous measurements but has a precision that is better by a factor of 4. In the same experiment, we have also measured the non-analogue branching ratios and could determine the super-allowed one with a precision similar to the previously reported measurements. The experiment was done at the Accelerator Laboratory of the University of Jyvaskyla where we used the IGISOL technique with the JYFLTRAP facility to separate pure samples of 26Si.
We have measured the half-life of 30S, the parent of a superallowed 0+-to-0+ beta transition, to high precision using very pure sources and a 4pi proportional gas counter to detect the decay positrons. Our result for the half-life is 1.17992(34) s. As a byproduct of this measurement, we determined the half-life of its daughter, 30P, to be 2.501(2) min.
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