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Register a new userMeasurement of the $^{20}$F half-life
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The half-life of the $^{20}$F ground state has been measured using a radioactive beam implanted in a plastic scintillator and recording $betagamma$ coincidences together with four CsI(Na) detectors. The result, $T_{1/2} = 11.0011(69)_{rm stat}(30)_{rm sys}$~s, is at variance by 17 combined standard deviations with the two most precise results. The present value revives the poor consistency of results for this half-life and calls for a new measurement, with a technique having different sources of systematic effects, to clarify the discrepancy.
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The beta-decay half-life of 26Si was measured with a relative precision of 1.4*10e3. The measurement yields a value of 2.2283(27) s which is in good agreement with previous measurements but has a precision that is better by a factor of 4. In the same experiment, we have also measured the non-analogue branching ratios and could determine the super-allowed one with a precision similar to the previously reported measurements. The experiment was done at the Accelerator Laboratory of the University of Jyvaskyla where we used the IGISOL technique with the JYFLTRAP facility to separate pure samples of 26Si.
We have measured the half-life of 30S, the parent of a superallowed 0+-to-0+ beta transition, to high precision using very pure sources and a 4pi proportional gas counter to detect the decay positrons. Our result for the half-life is 1.17992(34) s. As a byproduct of this measurement, we determined the half-life of its daughter, 30P, to be 2.501(2) min.
The literature half-life value of 65Ga is based on only one experiment carried out more than 60 years ago and it has a relatively large uncertainty. In the present work this half-life is determined based on the counting of the gamma-rays following the beta-decay of 65Ga. Our new recommended half-life is 15.133 +- 0.028 min which is in agreement with the literature value but almost one order of magnitude more precise.
The beta-decay half-life of 62Ga has been studied with high precision using on-line mass separated samples. The decay of 62Ga which is dominated by a 0+ to 0+ transition to the ground state of 62Zn yields a half-life of T_{1/2} = 116.19(4) ms. This result is more precise than any previous measurement by about a factor of four or more. The present value is in agreement with older literature values, but slightly disagrees with a recent measurement. We determine an error weighted average value of all experimental half-lives of 116.18(4) ms.
We have measured the half-life of the superallowed 0+ -to- 0+ beta+ emitter 26Si to be 2245.3(7) ms. We used pure sources of 26Si and employed a high-efficiency gas counter, which was sensitive to positrons from both this nuclide and its daughter 26mAl. The data were analyzed as a linked parent-daughter decay. To contribute meaningfully to any test of the unitarity of the Cabibbo-Kobayashi-Maskawa (CKM) matrix, the ft value of a superallowed transition must be determined to a precision of 0.1% or better. With a precision of 0.03% the present result is more than sufficient to be compatable with that requirement. Only the branching ratio now remains to be measured precisely before a +/-0.1% ft value can be obtained for the superallowed transition from 26Si.
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