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Register a new userMeasuring the plasma-wall charge by infrared spectroscopy
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We show that the charge accumulated by a dielectric plasma-facing solid can be measured by infrared spectroscopy. The approach utilizes a stack of materials supporting a surface plasmon resonance in the infrared. For frequencies near the Berreman resonance of the layer facing the plasma the reflectivity dip--measured from the back of the stack, not in contact with the plasma--depends strongly on the angle of incidence making it an ideal sensor for the changes of the layers dielectric function due to the polarizability of the trapped surplus charges. The charge-induced shifts of the dip, both as a function of the angle and the frequency of the incident infrared light, are large enough to be measurable by attenuated total reflection setups.
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We propose to measure the surface charge accumulating at the interface between a plasma and a dielectric by infrared spectroscopy using the dielectric as a multi-internal reflection element. The surplus charge leads to an attenuation of the transmitted signal from which the magnitude of the charge can be inferred. Calculating the optical response perturbatively in first order from the Boltzmann equation for the electron-hole plasma inside the solid, we can show that in the parameter range of interest a classical Drude term results. Only the integrated surface charge enters, opening up thereby a very efficient analysis of measured data.
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