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Single photon detection with SiPMs irradiated up to 10$^{14}$ cm$^{-2}$ 1-MeV-equivalent neutron fluence

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 Added by Claudio Gotti
 Publication date 2018
  fields Physics
and research's language is English




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Silicon photomultipliers (SiPM) are solid state light detectors with sensitivity to single photons. Their use in high energy physics experiments, and in particular in ring imaging Cherenkov (RICH) detectors, is hindered by their poor tolerance to radiation. At room temperature the large increase in dark count rate makes single photon detection practically impossible already at 10$^{11}$ cm$^{-2}$ 1-MeV-equivalent neutron fluence. The neutron fluences foreseen by many subdetectors to be operated at the high luminosity LHC range up to 10$^{14}$ cm$^{-2}$ 1-MeV-equivalent. In this paper we present the effects of such high neutron fluences on Hamamatsu and SensL SiPMs of different cell size. The advantage of annealing at high temperature (up to 175 $^{circ}$C) is discussed. We demonstrate that, after annealing, operation at the single photon level with a SiPM irradiated up to 10$^{14}$ cm$^{-2}$ 1-MeV-equivalent neutron fluence is possible at cryogenic temperature (77 K) with a dark count rate below 1~kHz.



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Silicon Photo-Multipliers (SiPM) are becoming the photo-detector of choice for increasingly more particle detection applications, from fundamental physics to medical and societal applications. One major consideration for their use at high-luminosity colliders is the radiation damage induced by hadrons, which leads to a dramatic increase of the dark count rate. KETEK SiPMs have been exposed to various fluences of reactor neutrons up to $Phi_{neq}$ = 5$times$10$^{14}$ cm$^{-2}$ (1 MeV equivalent neutrons). Results from the I-V, and C-V measurements for temperatures between $-$30$^circ$C and $+$30$^circ$C are presented. We propose a new method to quantify the effect of radiation damage on the SiPM performance. Using the measured dark current the single pixel occupation probability as a function of temperature and excess voltage is determined. From the pixel occupation probability the operating conditions for given requirements can be optimized. The method is qualitatively verified using current measurements with the SiPM illuminated by blue LED light.
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