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Demonstration of single-shot picosecond time-resolved MeV electron imaging using a compact permanent magnet quadrupole based lens

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 Added by David Cesar
 Publication date 2016
  fields Physics
and research's language is English




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We present the results of an experiment where a short focal length (~ 1.3 cm) permanent magnet electron lens is used to image micron-size features of a metal sample in a single shot, using an ultra- high brightness ps-long 4 MeV electron beam from a radiofrequency photoinjector. Magnifcation ratios in excess of 30x were obtained using a triplet of compact, small gap (3.5 mm), Halbach-style permanent magnet quadrupoles with nearly 600 T/m field gradients. These results pave the way to- wards single shot time-resolved electron microscopy and open new opportunities in the applications of high brightness electron beams.

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High gradient quadrupoles are necessary for different applications such as laser plasma acceleration, colliders, and diffraction limited light sources. Permanent magnet quadrupoles provide a higher field strength and compactness than conventional electro-magnets. An original design of permanent magnet based quadrupole (so-called QUAPEVA), composed of a Halbach ring placed in the center with a bore radius of 6 mm and surrounded by four permanent magnet cylinders capable of providing a gradient of 210 T/m, is presented. The design of the QUAPEVAs, including magnetic simulation modeling, and mechanical issues are reported. Magnetic measurements of seven systems of different lengths are presented and confirmed the theoretical expectations. The variation of the magnetic center while changing the gradient strength is +/- 10 micrometer. A triplet of three QUAPEVA magnets are used to focus a beam with large energy spread and high divergence that is generated by Laser Plasma Acceleration source for a free electron laser demonstration.
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In the past decade, the bunch lengths of electrons in accelerators have decreased dramatically to the range of a few picoseconds cite{Uesaka94,Trotz97}. Measurement of the length as well as the longitudinal profile of these short bunches have been a topic of research in a number of institutions cite{Uesaka97,Liu97,Hutchins00}. One of the techniques uses the electric field induced by the passage of electrons in the vicinity of a birefringent crystal to change its optical characteristics. Well-established electro-optic techniques can then be used to measure the temporal characteristics of the electron bunch. In this paper we present a novel, non-invasive, single-shot approach to improve the resolution to tens of femtoseconds so that sub-millimeter bunch length can be measured.
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