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Register a new userData-driven research on chemical features of Jingdezhen and Longquan celadon by energy dispersive X-ray fluorescence
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The energy dispersive X-ray fluorescence (EDXRF) is used to determine the chemical composition of celadon body and glaze in Longquan kiln (at Dayao County) and Jingdezhen kiln. Forty typical shards in four cultural eras were selected to investigate the raw materials and firing technology. Random forests, a relatively new statistical technique, has been adopted to identify chemical elements that are strongest explanatory variables to classify samples into defferent cultural eras and kilns. The results indicated that the contents of Na2O, Fe2O3, TiO2, SiO2 and CaO vary in celadon bodies from Longquan and Jingdezhen, which implies that local clay was used to manufacture celadon bodies in Jingdezhen kiln. By comparing the chemical composition in glaze, we find that the chemical elements and firing technology of Jingdezhen kiln are very similar to those in Longquan kiln, especially for Ming dynasty. This study reveals the inheritance between Jingdezhen kiln and Longquan kiln, and explains the differences between those two kilns.
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In this paper we report the development of a new method for the evaluation of thin films mass thickness and composition based on the Energy Dispersive X-Ray Spectroscopy (EDS). The method exploits the theoretical calculation of the in-depth characteristic X-ray generation distribution function, $phi$/($rho$ z), in multilayer samples, obtained by the numerical solution of the electron transport equation, to achieve reliable measurements without the need of a reference sample and multiple voltages acquisitions. The electron transport model is derived from the Boltzmann transport equation and it exploits the most updated and reliable physical parameters in order to obtain an accurate description of the phenomenon. The method for the calculation of film mass thickness and composition is validated with benchmarks from standard techniques. In addition, a model uncertainty and sensitivity analysis is carried out and it indicates that the mass thickness accuracy is in the order of 10 $mu$g/cm$^2$, which is comparable to the nuclear standard techniques resolution. We show the technique peculiarities in one example measurement: two-dimensional mass thickness and composition profiles are obtained for a ultra-low density, high roughness, nanostructured film.
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A technique has been developed for depositing diamond crystals on the endfaces of optical fibers and capturing the fluorescence generated by optically active defects in the diamond into the fiber. This letter details the diamond growth on optical fibers and transmission of fluorescence through the fiber from the nitrogen-vacancy (N-V) color center in diamond. Control of the concentration of defects incorporated during the chemical vapor deposition (CVD) growth process is also demonstrated. These are the first critical steps in developing a fiber coupled single photon source based on optically active defect centers in diamond.
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