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Register a new userMeasurement of the energy resolution and calibration of hybrid pixel detectors with GaAs:Cr sensor and Timepix readout chip
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This paper describes an iterative method of per-pixel energy calibration of hybrid pixel detectors with GaAs:Cr sensor and Timepix readout chip. A convolution of precisely measured spectra of characteristic X-rays of different metals with the resolution and the efficiency of the pixel detector is used for the calibration. The energy resolution of the detector is also measured during the calibration. The use of per-pixel calibration allows to achieve a good energy resolution of the Timepix detector with GaAs:Cr sensor: 8% and 13% at 60 keV and 20 keV, respectively.
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It is the hybrid pixel detector technology which brought to the X-ray imaging a low noise level at a high spatial resolution, thanks to the single photon counting. However, silicon as the most widespread detector material is marginally sensitive to photons with energy more than 30 keV. Thats why the high-Z alternatives to silicon such as gallium arsenide and cadmium telluride are increasingly attracting attention of the community for the development of X-ray imaging systems in recent years. We present in this work the results of our investigations of the Timepix detectors bump-bonded with sensors made of gallium arsenide compensated by chromium (GaAs:Cr). The properties which are mostly important from the practical point of view: IV characteristics, charge transport characteristics, operational stability, homogeneity, temperature dependence as well as energy and spatial resolution are considered. Applicability of these detectors for spectroscopic X-ray imaging is discussed.
We have operated a Medipix2 CMOS readout chip, with amplifying, shaping and charge discriminating front-end electronics integrated on the pixel-level, as a highly segmented direct charge collecting anode in a three-stage gas electron multiplier (Triple-GEM) to detect the ionization from $^{55}$Fe X-rays and electrons from $^{106}$Ru. The device allows to perform moderate energy spectroscopy measurements (20 % FWHM at 5.9 keV $X$-rays) using only digital readout and two discriminator thresholds. Being a truly 2D-detector, it allows to observe individual clusters of minimum ionizing charged particles in $Ar/CO_2$ (70:30) and $He/CO_2$ (70:30) mixtures and to achieve excellent spatial resolution for position reconstruction of primary clusters down to $sim 50 mu m$, based on the binary centroid determination method.
We present the implementation and verification of an in-pixel automatic threshold calibration circuit for the CMS Endcap Timing Layer (ETL) in the High-Luminosity LHC upgrade. The discriminator threshold of the ETL readout chip (ETROC) needs to be calibrated regularly to mitigate the circuit baseline change. Traditional methods need a lot of communication through a slow control system hence are time-consuming. This paper describes an in-pixel automatic scheme with improvements in operating time and usability. In this scheme, a sample-accumulation circuit is used to measure the average discriminator output. A binary successive approximation and linear combination scan are applied to find the equivalent baseline. The actual calibration procedure has been first implemented in FPGA firmware and tested with the ETROC front-end prototype chip (ETROC0). The calibration circuit has been implemented with Triple Modular Redundancy (TMR) and verified with Single Event Effects (SEEs) simulation. A complete calibration process lasts 35 ms with a 40 MHz clock. In the worst case, the dynamic and static power consumption are estimated to be 300 uW and 10.4 uW, respectively. The circuit design, implemented in a 65 CMOS technology, will be integrated into ETROC2, the next iteration of the ETROC with a 16x16 pixel matrix.
Using simulations and analytical approaches, we have studied single hit resolutions obtained with a binary readout, which is often proposed for high granularity detectors to reduce the generated data volume. Our simulations considering several parameters (e.g. strip pitch) show that the detector geometry and an electronics parameter of the binary readout chips could be optimized for binary readout to offer an equivalent spatial resolution to the one with an analogue readout. To understand the behavior as a function of simulation parameters, we developed analytical models that reproduce simulation results with a few parameters. The models can be used to optimize detector designs and operation conditions with regard to the spatial resolution.
In this paper a detailed simulation of irradiated pixel sensors was used to investigate the effects of radiation damage on charge sharing and position determination. The simulation implements a model of radiation damage by including two defect levels with opposite charge states and trapping of charge carriers. We show that charge sharing functions extracted from the simulation can be parameterized as a function of the inter-pixel position and used to improve the position determination. For sensors irradiated to Phi=5.9x10^14 n/cm^2 a position resolution below 15 um can be achieved after calibration.
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