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Register a new userProximity effects at the interface of a superconductor and a topological insulator in NbN - Bi_2Se_3 thin film bilayers
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Authors
Gad Koren
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In a search for a simple proximity system of a topological insulator and a superconductor for studying the role of surface versus bulk effects by gating, we report here on a first step toward this goal, namely the choice of such a system and its characterization. We chose to work with thin film bilayers of grainy 5 nm thick NbN films as the superconductor, overlayed with 20 nm thick topological layer of $rm Bi_2Se_3$ and compare the transport results to those obtained on a 5 nm thick reference NbN film on the same wafer. Bilayers with ex-situ and in-situ prepared $rm NbN-Bi_2Se_3$ interfaces were studied and two kinds of proximity effects were found. At high temperatures just below the superconducting transition, all bilayers showed a conventional proximity effect where the topological $rm Bi_2Se_3$ suppresses the onset or mid-transition $T_c$ of the superconducting NbN films by about 1 K. At low temperatures, a cross-over of the resistance versus temperature curves of the bilayer and reference NbN film occurs, where the bilayers show enhancement of $T_c(R=0)$, $I_c$ (the supercurrent) and the Andreev conductance, as compared to the bare NbN films. This indicates that superconductivity is induced in the $rm Bi_2Se_3$ layer at the interface region in between the NbN grains. Thus an inverse proximity effect in the topological material is demonstrated.
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Ultrathin $rm Bi_2Se_3$-NbN bilayers comprise a simple proximity system of a topological insulator and an s-wave superconductor for studying gating effects on topological superconductors. Here we report on 3 nm thick NbN layers of weakly connected superconducting islands, overlayed with 10 nm thick $rm Bi_2Se_3$ film which facilitates enhanced proximity coupling between them. Resistance versus temperature of the most resistive bilayers shows insulating behavior but with signs of superconductivity. We measured the magnetoresistance (MR) of these bilayers versus temperature with and without a magnetic field H normal to the wafer (MR=[R(H)-R(0)]/{[R(H)+R(0)]/2}), and under three electric gate-fields of 0 and $pm2$ MV/cm. The MR results showed a complex set of gate sensitive peaks which extended up to about 30 K. The results are discussed in terms of vortex physics, and the origin of the different MR peaks is identified and attributed to flux-flow MR in the isolated NbN islands and the different proximity regions in the $rm Bi_2Se_3$ cap-layer. The dominant MR peak was found to be consistent with enhanced proximity induced superconductivity in the topological edge currents regions. The high temperature MR data suggest a possible pseudogap phase or a highly extended fluctuation regime.
The proximity coupled topological insulator / superconductor (TI/SC) bilayer system is a representative system to realize topological superconductivity. In order to better understand this unique state and design devices from the TI/SC bilayer, a comprehensive understanding of the microscopic properties of the bilayer is required. In this work, a microwave Meissner screening study, which exploits a high-precision microwave resonator technique, is conducted on the SmB6/YB6 thin film bilayers as an example TI/SC system. The study reveals spatially dependent electrodynamic screening response of the TI/SC system that is not accessible to other techniques, from which the corresponding microscopic properties of a TI/SC bilayer can be obtained. The TI thickness dependence of the effective penetration depth suggests the existence of a bulk insulating region in the TI layer. The spatially dependent electrodynamic screening model analysis provides an estimate for the characteristic lengths of the TI/SC bilayer: normal penetration depth, normal coherence length, and the thickness of the surface states. We also discuss implications of these characteristic lengths on the design of a vortex Majorana device such as the radius of the vortex core, the energy splitting due to intervortex tunneling, and the minimum thickness required for a device.
Magnetic proximity effect of a topological insulator in contact with a ferromagnet is reported in thin film bilayers of 15 nm thick $BiSbTe_3$ on either 15 or 40 nm thick $SrRuO_3$ on (100) $SrTiO_3$ wafers. Magneto transport results of the bilayers were compared with those of reference films of 15 nm $BiSbTe_3$ and 15 or 40 nm $SrRuO_3$. Comparison of the temperature coefficient of resistance [(1/R)$times$dR/dT which is qualitatively proportional to the magnetization] of the bilayer and reference ferromagnetic film normalized above $T_c$, shows a clear suppression in the bilayer by about 50% just below $T_c$, indicating a weaker proximity magnetization in the bilayer. Resistance hysteresis loops versus field at 1.85$pm$0.05 K in the bilayer and reference films show a clear magnetic proximity effect, where the peak resistance of the bilayer at the coercive field shifts to lower fields by $sim$30% compared to a hypothetical bilayer of two resistors connected in parallel with no interaction between the layers. Narrowing of the coercive peaks of the bilayers as compared to those of the reference ferromagnetic films by 25-35% was also observed, which represents another signature of the magnetic proximity effect.
Ramp-type junctions of $rm Au-Bi_2Se_3-NbN$ were prepared on top of a bottom gate comprised of a $rm SrTiO_3$ gate-insulator film on $rm NbN$ gate-electrode layer on (100) $rm SrTiO_3$ wafer. Two wafers with gate-insulator thickness of 120 and 240 nm were studied, with the former showing higher gate leakage currents Ig at high gate voltages Vg, leading to heating effects and shifting of the junctions conductance spectra versus the voltage bias. At Vg=0 V, the conductance spectra of the low resistance junctions showed zero bias conductance peaks inside a tunneling gap with typical conductance drops when the critical current Ic was reached, while the high resistance ones exhibited tunneling conductance only. For Vg$>$-0.2 V ($rm Esimeq$ -2 MV/cm) of the wafer with 120 nm thick gate-insulator linear Ig vs Vg was found, while for Vg$<$-0.2 V, Ig saturation was observed, leading to quadratic and linear heating effects at positive and negative high Vg values, respectively. This led to asymmetric conductance spectra shifts versus Vg which followed almost exactly the Ig vs Vg behavior. In the wafer with twice the gate-insulator thickness (240 nm), heating effects were strongly suppressed, and symmetric small peak shifts appeared only under the highest Vg values of Vg=$pm$2 V ($rm Esimeq pm$ 10 MV/cm). Under Vg=2 V, a 5% lower conductance was observed as compared to Vg=-2 V, indicating a small Fermi energy shift in our junctions under $pm$10 MV/cm fields.
We investigate inverse proximity effects in a spin-triplet superconductor (TSC) interfaced with a ferromagnet (FM), assuming different types of magnetic profiles and chiral or helical pairings. The region of the coexistence of spin-triplet superconductivity and magnetism is significantly influenced by the orientation and spatial extension of the magnetization with respect to the spin configuration of the Cooper pairs, resulting into clearcut anisotropy signatures. A characteristic mark of the inverse proximity effect arises in the induced spin-polarization at the TSC interface. This is unexpectedly stronger when the magnetic proximity is weaker, thus unveiling immediate detection signatures for spin-triplet pairs. We show that an anomalous magnetic proximity can occur at the interface between the itinerant ferromagnet, SrRuO$_3$, and the unconventional superconductor Sr$_2$RuO$_4$. Such scenario indicates the potential to design characteristic inverse proximity effects in experimentally available SrRuO$_3$-Sr$_2$RuO$_4$ heterostructures and to assess the occurrence of spin-triplet pairs in the highly debated superconducting phase of Sr$_2$RuO$_4$.
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