Subscribe to the gold package and get unlimited access to Shamra Academy
Register a new userHigh-fidelity preparation, gates, memory and readout of a trapped-ion quantum bit
104
0
0.0
(
0
)
Ask ChatGPT about the research
No Arabic abstract
We implement all single-qubit operations with fidelities significantly above the minimum threshold required for fault-tolerant quantum computing, using a trapped-ion qubit stored in hyperfine atomic clock states of $^{43}$Ca$^+$. We measure a combined qubit state preparation and single-shot readout fidelity of 99.93%, a memory coherence time of $T^*_2=50$ seconds, and an average single-qubit gate fidelity of 99.9999%. These results are achieved in a room-temperature microfabricated surface trap, without the use of magnetic field shielding or dynamic decoupling techniques to overcome technical noise.
rate research
Read More
We demonstrate single-shot qubit readout with fidelity sufficient for fault-tolerant quantum computation, for two types of qubit stored in single trapped calcium ions. For an optical qubit stored in the (4S_1/2, 3D_5/2) levels of 40Ca+ we achieve 99.991(1)% average readout fidelity in one million trials, using time-resolved photon counting. An adaptive measurement technique allows 99.99% fidelity to be reached in 145us average detection time. For a hyperfine qubit stored in the long-lived 4S_1/2 (F=3, F=4) sub-levels of 43Ca+ we propose and implement a simple and robust optical pumping scheme to transfer the hyperfine qubit to the optical qubit, capable of a theoretical fidelity 99.95% in 10us. Experimentally we achieve 99.77(3)% net readout fidelity, inferring at least 99.87(4)% fidelity for the transfer operation.
We demonstrate laser-driven two-qubit and single-qubit logic gates with fidelities 99.9(1)% and 99.9934(3)% respectively, significantly above the approximately 99% minimum threshold level required for fault-tolerant quantum computation, using qubits stored in hyperfine ground states of calcium-43 ions held in a room-temperature trap. We study the speed/fidelity trade-off for the two-qubit gate, for gate times between 3.8$mu$s and 520$mu$s, and develop a theoretical error model which is consistent with the data and which allows us to identify the principal technical sources of infidelity.
We present a method that combines continuous and pulsed microwave radiation patterns to achieve robust interactions among hyperfine trapped ions placed in a magnetic field gradient. More specifically, our scheme displays continuous microwave drivings with modulated phases, phase flips, and $pi$ pulses. This leads to high-fidelity entangling gates which are resilient against magnetic field fluctuations, changes on the microwave amplitudes, and crosstalk effects. Our protocol runs with arbitrary values of microwave power, which includes the technologically relevant case of low microwave intensities. We demonstrate the performance of our method with detailed numerical simulations that take into account the main sources of decoherence.
We study the speed/fidelity trade-off for a two-qubit phase gate implemented in $^{43}$Ca$^+$ hyperfine trapped-ion qubits. We characterize various error sources contributing to the measured fidelity, allowing us to account for errors due to single-qubit state preparation, rotation and measurement (each at the $sim0.1%$ level), and to identify the leading sources of error in the two-qubit entangling operation. We achieve gate fidelities ranging between $97.1(2)%$ (for a gate time $t_g=3.8mu$s) and $99.9(1)%$ (for $t_g=100mu$s), representing respectively the fastest and lowest-error two-qubit gates reported between trapped-ion qubits by nearly an order of magnitude in each case.
We demonstrate a two-qubit logic gate driven by near-field microwaves in a room-temperature microfabricated ion trap. We measure a gate fidelity of 99.7(1)%, which is above the minimum threshold required for fault-tolerant quantum computing. The gate is applied directly to $^{43}$Ca$^+$ atomic clock qubits (coherence time $T_2^*approx 50,mathrm{s}$) using the microwave magnetic field gradient produced by a trap electrode. We introduce a dynamically-decoupled gate method, which stabilizes the qubits against fluctuating a.c. Zeeman shifts and avoids the need to null the microwave field.
Log in to be able to interact and post comments
comments
Fetching comments
Sign in to be able to follow your search criteria
