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Register a new userLimitation in thin-film detection with transmission-mode terahertz time-domain spectroscopy
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Added by
Withawat Withayachumnankul
Publication date
2011
fields
Physics
and research's language is
English
Authors
Withawat Withayachumnankul
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In transmission-mode terahertz time-domain spectroscopy (THz-TDS), the thickness of a sample is a critical factor that determines an amount of the interaction between terahertz waves and bulk material. If the interaction length is too small, a change in the transmitted signal is overwhelmed by fluctuations and noise in the system. In this case, the sample can no longer be detected. This article presents a criterion to determine the lower thickness boundary of a free-standing film that can still be detectable by free-space transmission-mode THz-TDS. The rigorous analysis yields a simple proportional relation between the sample optical length and the system SNR. The proposed criterion can help to decide whether an alternative terahertz thin-film sensing modality is necessary.
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Planar metamaterials have been recently proposed for thin dielectric film sensing in the terahertz frequency range. Although the thickness of the dielectric film can be very small compared with the wavelength, the required area of sensed material is still determined by the diffraction-limited spot size of the terahertz beam excitation. In this article, terahertz near-field sensing is utilized to reduce the spot size. By positioning the metamaterial sensing platform close to the sub-diffraction terahertz source, the number of excited resonators, and hence minimal film area, are significantly reduced. As an additional advantage, a reduction in the number of excited resonators decreases the inter-cell coupling strength, and consequently the resonance Q factor is remarkably increased. The experimental results show that the resonance Q factor is improved by 113%. Moreover, for a film with a thickness of lambda/375 the minimal area can be as small as 0.2lambda by 0.2lambda. The success of this work provides a platform for future metamaterial-based sensors for biomolecular detection.
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We present high precision measurements of polarization rotations in the frequency range from 0.1 to 2.5 THz using a polarization modulation technique. A motorized stage rotates a polarizer at ~80 Hz, and the resulting modulation of the polarization is measured by a lock-in technique. We achieve an accuracy of 0.05{deg} (900 {mu}rad) and a precision of 0.02{deg} (350 {mu}rad) for small rotation angles. A detailed mathematical description of the technique is presented, showing its ability to fully characterize elliptical polarizations from 0.1 to 2.5 THz.
Erbium-doped lithium niobate on insulator (LNOI) laser plays an important role in the complete photonic integrated circuits (PICs). Here, we demonstrate an integrated tunable whisper galley single mode laser (WGSML) by making use of a pair of coupled microdisk and microring on LNOI. A 974 nm single-mode pump light can have an excellent resonance in the designed microdisk, which is beneficial to the whisper gallery mode (WGM) laser generation. The WGSML at 1560.40 nm with a maximum 31.4 dB side mode suppression ratio (SMSR) has been achieved. By regulating the temperature, WGSMLs output power increased and the central wavelength can be changed from 1560.30 nm to 1560.40 nm. Whats more, 1560.60 nm and 1565.00 nm WGSMLs have been achieved by changing the coupling gap width between microdisk and microring. We can also use the electro-optic effect of LNOI to obtain more accurate adjustable WGSMLs in further research.
We present a maximum-likelihood method for parameter estimation in terahertz time-domain spectroscopy. We derive the likelihood function for a parameterized frequency response function, given a pair of time-domain waveforms with known time-dependent noise amplitudes. The method provides parameter estimates that are superior to other commonly-used methods, and provides a reliable measure of the goodness of fit. We also develop a simple noise model that is parameterized by three dominant sources, and derive the likelihood function for their amplitudes in terms of a set of repeated waveform measurements. We demonstrate the method with applications to material characterization.
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