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A very recent article [(1) E. Zakka-Bajjani et al., PRL104, 206802 (2010)] has addressed the problem of how the statistics of electrons crossing a quantum conductor influences that of the photons they emit. It is however not clear that the detection used in [1] is sensitive to emitted photons and not to the overall electromagnetic fluctuations, which include vacuum fluctuations. We show that the proof in [1] that non-symmetrized noise is detected is erroneous: supposing that the detection simply takes the square of the voltage, i.e. is sensitive to vacuum fluctuations, leads to identical results. We demonstrate that all the results can be explained in terms of usual gaussian voltage fluctuations instead of photon statistics. Finally, it is found in [1] that the photon noise is gaussian for a tunnel junction, for which the electron counting statistics is poissonian. We show that this result is beyond the experimental sensitivity by at least one order of magnitude, and thus is also incorrect.
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We report on a microwave Hanbury-Brown Twiss experiment probing the statistics of GHz photons emitted by a tunnel junction in the shot noise regime at low temperature. By measuring the crosscorrelated fluctuations of the occupation numbers of the photon modes of both detection branches we show that, while the statistics of electrons is Poissonian, the photons obey chaotic statistics. This is observed even for low photon occupation number when the voltage across the junction is close to $h u/e$.
We show experimentally that a dc biased Josephson junction in series with a high-enough impedance microwave resonator emits antibunched photons. Our resonator is made of a simple micro-fabricated spiral coil that resonates at 4.4 GHz and reaches a 1.97 k$Omega$ characteristic impedance. The second order correlation function of the power leaking out of the resonator drops down to 0.3 at zero delay, which demonstrates the antibunching of the photons emitted by the circuit at a rate of 6 $10^7$ photons per second. Results are found in quantitative agreement with our theoretical predictions. This simple scheme could offer an efficient and bright single-photon source in the microwave domain.
Strongly correlated low-dimensional systems can host exotic elementary excitations carrying a fractional charge $q$ and potentially obeying anyonic statistics. In the fractional quantum Hall effect, their fractional charge has been successfully determined owing to low frequency shot noise measurements. However, a universal method for sensing them unambiguously and unraveling their intricate dynamics was still lacking. Here, we demonstrate that this can be achieved by measuring the microwave photons emitted by such excitations when they are transferred through a potential barrier biased with a dc voltage $V_{text{dc}}$. We observe that only photons at frequencies $f$ below $qV_{text{dc}}/h$ are emitted. This threshold provides a direct and unambiguous determination of the charge $q$, and a signature of exclusion statistics. Derived initially within the Luttinger model, this feature is also predicted by universal non-equilibrium fluctuation relations which agree fully with our measurements. Our work paves the way for further exploration of anyonic statistics using microwave measurements.
We derive fluctuation-dissipation relations for a tunnel junction driven by a high impedance microwave resonator, displaying strong quantum fluctuations. We find that the fluctuation-dissipation relations derived for classical forces hold, provided the effect of the circuits quantum fluctuations is incorporated into a modified non-linear $I(V)$ curve. We also demonstrate that all quantities measured under a coherent time dependent bias can be reconstructed from their dc counterpart with a photo-assisted tunneling relation. We confirm these predictions by implementing the circuit and measuring the dc current through the junction, its high frequency admittance and its current noise at the frequency of the resonator.
We measure the current vs voltage (I-V) characteristics of a diodelike tunnel junction consisting of a sharp metallic tip placed at a variable distance d from a planar collector and emitting electrons via electric-field assisted emission. All curves collapse onto one single graph when I is plotted as a function of the single scaling variable Vd^{-lambda}, d being varied from a few mm to a few nm, i.e., by about six orders of magnitude. We provide an argument that finds the exponent {lambda} within the singular behavior inherent to the electrostatics of a sharp tip. A simulation of the tunneling barrier for a realistic tip reproduces both the scaling behavior and the small but significant deviations from scaling observed experimentally.
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