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Register a new userTransmission and diffraction properties of a narrow slit in ideal metal
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By solving Maxwell equations with the ideal-metal boundary conditions in the TM case, we have fully described the transmission and diffraction properties of a single slit regardless of its width. Efficiencies of the main transformation processes -- transmission, diffraction, and reflection -- are analyzed in the sub-to-few-wavelength range showing a number of sharp fundamental features. Close links with the case of real metal are considered.
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Neutron diffraction has been used to investigate antiferromagnetism since 1949. Here we show that antiferromagnetic reflections can also be seen in transmission electron diffraction patterns from NiO. The diffraction patterns taken here came from regions as small as 10.5 nm and such patterns could be used to form an image of the antiferromagnetic structure with a nanometre resolution.
In this paper we show how transmission metallic gratings with very narrow and deep enough slits can exhibit transmission resonances for wavelengths larger than the period of the grating. By using a transfer matrix formalism and a quasi-analytical model based on a modal expansion, we show that there are two possible ways of transferring light from the upper surface to the lower one: by the excitation of coupled surface plasmon polaritons on both surfaces of the metallic grating or by the coupling of incident plane waves with waveguide resonances located in the slits. Both mechanisms can lead to almost perfect transmittance for those particular resonances.
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VO2 is a much-discussed material for oxide electronics and neuromorphic computing applications. Here, heteroepitaxy of vanadium dioxide (VO2) was realized on top of oxide nanosheets that cover either the amorphous silicon dioxide surfaces of Si substrates or X-ray transparent silicon nitride membranes. The out-of-plane orientation of the VO2 thin films was controlled at will between (011)M1/(110)R and (-402)M1/(002)R by coating the bulk substrates with Ti0.87O2 and NbWO6 nanosheets, respectively, prior to VO2 growth. Temperature dependent X-ray diffraction and automated crystal orientation mapping in microprobe TEM mode (ACOM-TEM) characterized the high phase purity, the crystallographic and orientational properties of the VO2 films. Transport measurements and soft X-ray absorption in transmission are used to probe the VO2 metal-insulator transition, showing results of a quality equal to those from epitaxial films on bulk single-crystal substrates. Successful local manipulation of two different VO2 orientations on a single substrate is demonstrated using VO2 grown on lithographically-patterned lines of Ti0.87O2 and NbWO6 nanosheets investigated by electron backscatter diffraction. Finally, the excellent suitability of these nanosheet-templated VO2 films for advanced lensless imaging of the metal-insulator transition using coherent soft X-rays is discussed.
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