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Register a new userSubwavelength internal imaging by means of the wire medium
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Evanescent wave amplification is observed, for the first time to our knowledge, inside a half-wavelength-thick wire medium slab used for subwavelength imaging. The wire medium is analyzed using both a spatially dispersive finite-difference time-domain (FDTD) method and a full-wave commercial electromagnetic simulator CST Microwave Studio. In this work we demonstrate that subwavelength details of a source placed at a distance of one-tenth of a wavelength from a wire medium slab can be detected inside the slab with a resolution of approximately one-tenth of a wavelength in spite of the fact that they cannot be resolved at the front interface of the device, due to the rapid decay of evanescent spatial harmonics in free space.
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An experimental investigation of sub-wavelength imaging by a wire medium slab is performed. A complex-shaped near field source is used in order to test imaging performance of the device. It is demonstrated that the ultimate bandwidth of operation of the constructed imaging device is 4.5% that coincides with theoretical predictions [Phys. Rev. E 73, 056607 (2006)]. Within this band the wire medium slab is capable of transmitting images with lambda/15 resolution irrespectively of the shape and complexity of the source. Actual bandwidth of operation for particular near-field sources can be larger than the ultimate value but it strongly depends on the configuration of the source.
The electromagnetic field on the metal surface launched by a subwavelength slit is analytically studied, for the case when the fundamental mode inside the slit has a wavevector component along the slit axis (conical mount). Both near-field and far-field regions are discussed, and the role of surface plasmon-polaritons and Norton waves is revealed. It is shown that the distance from the slit at which NW are more intense than surface plasmons decrease with parallel wavevector, which could help experimental studies on Norton waves. Additionally, it is found that the s-polarization component, while present for any non-zero parallel wavevector, only weakly contributes to the NWs.
As one of important analysis tools, microscopes with high spatial resolution are indispensable for scientific research and medical diagnosis, and much attention is always focused on the improvement of resolution. Over the past decade, a novel technique called ghost imaging has been developed that may provide a new approach toward increasing the resolution of an imaging system. In this paper, we introduce this technique into microscopes for the first time and report a proof-of-principle experimental demonstration of a microscope scheme based on ghost imaging.
Imaging below the diffraction limit is always a public interest because of the restricted resolution of conventional imaging systems. To beat the limit, evanescent harmonics decaying in space must participate in the imaging process. Here, we introduce the method of spatial spectrum sampling, a novel far-field superresolution imaging method for microwave and terahertz regime. Strong dispersion and momentum conservation allow the spoof surface plasmon polaritons (SSP) structure to become a sensitive probe for spatial harmonics. This enables that the spatial information of the targets including both propagating and evanescent components, can be extracted by tuning and recording SSP in the far field. Then, the subwavelength resolution is constructed by the inversed Fourier transform of the sampled spatial spectrum. Using the modified subwavelength metallic grating as the spoof plasmonic structure, a far-field resolution of 0.17 wavelength is numerically and experimentally verified, and two-dimensional imaging ability is also fully discussed. The imaging ability and flexibility can be further optimizing the SSP structures. We are confident that our working mechanism will have great potentials in the superresolution imaging applications in the microwave and terahertz frequency range
Rigourous calculations of the imaging properties of metamaterials consisting of metal-coated semiconductor nanoparticles are presented. In particular, it is shown that under proper choice of geometric and materials parameters, arrays of such particles exhibit negative refractive index within the region of the excitonic resonance of the semiconductor. The occurrence of negative refractive index is predicted by the extended Maxwell-Garnett theory and confirmed by a layer-multiple scattering method for electromagnetic waves. By using the same method it is shown that within the negative refractive-index band, arrays of such nanoparticles amplify the transmitted near-field emitted while simultaneously narrow down its spatial profile leading to subwavelength resolution. The effect of material losses to the imaging properties of the arrays is also addressed.
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