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Nuclear magnetic resonance force microscopy with a microwire rf source

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 Added by Martino Poggio
 Publication date 2007
  fields Physics
and research's language is English




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We use a 1.0-um-wide patterned Cu wire with an integrated nanomagnetic tip to measure the statistical nuclear polarization of 19F in CaF2 by magnetic resonance force microscopy (MRFM). With less than 350 uW of dissipated power, we achieve rf magnetic fields over 4 mT at 115 MHz for a sample positioned within 100 nm of the microwire rf source. A 200-nm diameter FeCo tip integrated onto the wire produces field gradients greater than 10^5 T/m at the same position. The large rf fields from the broadband microwire enable long rotating-frame spin lifetimes of up to 15 s at 4 K.



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203 - M. Poggio , B. E. Herzog 2017
The drive to improve the sensitivity of nuclear magnetic resonance (NMR) to smaller and smaller sample volumes has led to the development of a variety of techniques distinct from conventional inductive detection. In this chapter, we focus on the technique of force-detected NMR as one of the most successful in yielding sensitivity improvements. We review the rationale for the technique, its basic principles, and give a brief history of its most important results. We then cover in greater detail its application in the first demonstration of three-dimensional (3D) nuclear magnetic resonance imaging (MRI) with nanometer-scale resolution. Next we present recent developments and likely paths for improvement. Finally, the technique and its potential are discussed in the context of competing and complementary technologies.
Magnetic resonance force microscopy (MRFM) is a scanning probe technique capable of detecting MRI signals from nanoscale sample volumes, providing a paradigm-changing potential for structural biology and medical research. Thus far, however, experiments have not reached suffcient spatial resolution for retrieving meaningful structural information from samples. In this work, we report MRFM imaging scans demonstrating a resolution of 0.9 nm and a localization precision of 0.6 nm in one dimension. Our progress is enabled by an improved spin excitation protocol furnishing us with sharp spatial control on the MRFM imaging slice, combined with overall advances in instrument stability. From a modeling of the slice function, we expect that our arrangement supports spatial resolutions down to 0.3 nm given suffcient signal-to-noise ratio. Our experiment demonstrates the feasibility of sub-nanometer MRI and realizes an important milestone towards the three-dimensional imaging of macromolecular structures.
Scanning probe microscopy is one of the most versatile windows into the nanoworld, providing imaging access to a variety of sample properties, depending on the probe employed. Tunneling probes map electronic properties of samples, magnetic and photonic probes image their magnetic and dielectric structure while sharp tips probe mechanical properties like surface topography, friction or stiffness. Most of these observables, however, are accessible only under limited circumstances. For instance, electronic properties are measurable only on conducting samples while atomic-resolution force microscopy requires careful preparation of samples in ultrahigh vacuum or liquid environments. Here we demonstrate a scanning probe imaging method that extends the range of accessible quantities to label-free imaging of chemical species operating on arbitrary samples - including insulating materials - under ambient conditions. Moreover, it provides three-dimensional depth information, thus revealing subsurface features. We achieve these results by recording nuclear magnetic resonance signals from a sample surface with a recently introduced scanning probe, a single nitrogen-vacancy center in diamond. We demonstrate NMR imaging with 10 nm resolution and achieve chemically specific contrast by separating fluorine from hydrogen rich regions. Our result opens the door to scanning probe imaging of the chemical composition and atomic structure of arbitrary samples. A method with these abilities will find widespread application in material science even on biological specimens down to the level of single macromolecules.
We present the design and implementation of a scanning probe microscope, which combines electrically detected magnetic resonance (EDMR) and (photo-)conductive atomic force microscopy ((p)cAFM). The integration of a 3-loop 2-gap X-band microwave resonator into an AFM allows the use of conductive AFM tips as a movable contact for EDMR experiments. The optical readout of the AFM cantilever is based on an infrared laser to avoid disturbances of current measurements by absorption of straylight of the detection laser. Using amorphous silicon thin film samples with varying defect densities, the capability to detect a spatial EDMR contrast is demonstrated. Resonant current changes as low as 20 fA can be detected, allowing the method to realize a spin sensitivity of 8*10^6 spins/Hz^0.5 at room temperature.
We report the quantum calibration of a magnetic force microscope (MFM) by measuring the two-dimensional magnetic stray field distribution of the tip MFM using a single nitrogen vacancy (NV) center in diamond. From the measured stray field distribution and the mechanical properties of the cantilever a calibration function is derived allowing to convert MFM images in quantum calibrated stray field maps. This novel approach overcomes limitations of prior MFM calibration schemes and allows quantum calibrated nanoscale stray field measurements in a field range inaccessible by scanning NV magnetometry. Quantum calibrated measurements of a stray field reference sample allow its use as a transfer standard opening the road towards fast and easily accessible quantum traceable calibration of virtually any MFM.
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