Thickness dependence of the ground-state properties in thin films of the heavy-fermion compound CeCu_6

High-quality thin polycrystalline films of the heavy-fermion compound CeCu_6 were prepared by sputter deposition. The thicker of these films (with thickness up to around 200 nm) reproduce the properties of the bulk compound CeCu_6. As the thickness of the films is decreased, our measurements display strong deviations from the bulk properties, namely, a suppression of the heavy-fermion state. We show that possible `external effects, like disorder, oxidation and morphology can be excluded and that this size effect is therefore an intrinsic property of CeCu_6. In addition, we investigate possible scenarios explaining the size effect, and find that the proximity of CeCu_6 to a quantum phase transition can account for this striking result.