Photoluminescence decay of silicon nanocrystals and L{e}vy stable distributions


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Recent experiments have shown that photoluminescence decay of silicon nanocrystals can be described by the stretched exponential function. We show here that the associated decay probability rate is the one-sided Levy stable distribution which describes well the experimental data. The relevance of these conclusions to the underlying stochastic processes is discussed in terms of Levy processes.

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