An analytical model for the domain wall structure in ultrathin films with perpendicular easy axis and interfacial Dzyaloshinskii-Moriya interaction, submitted to an arbitrary in-plane magnetic field, is presented. Its solution is simplified to the numerical minimization of an analytic function of just one variable. The model predictions are compared to numerical micromagnetic simulations, using parameters of existing samples, revealing a very good agreement. Remaining differences are analyzed, and partly corrected. Differences with the predictions of the simplest model, usually found in the literature, in which only the domain wall moments in-plane orientation can vary, are exemplified. The model allows accurate computations, as a function of in-plane field module and orientation, of the domain wall tension and width, quantities controlling the creep motion of domain walls in such films.
تحميل البحث