Developing a chip-based super-resolution imaging technique with large field-of-view (FOV), deep subwavelength resolution, and compatibility for both fluorescent and non-fluorescent samples is desired for material science, biomedicine, and life researches, etc. Previous on-chip super-resolution methods focus on either fluorescent or non-fluorescent imaging, putting an urgent requirement on the general imaging technique compatible with both of them. Here, we introduce a universal super-resolution imaging method based on tunable virtual-wavevector spatial frequency shift (TVSFS), realizing both labeled and label-free super-resolution imaging on a single delicately fabricated scalable photonic chip. Theoretically, with TVSFS, the diffraction limit of a linear optical system can be overcome, and the resolution can be improved more than three times, which is the limitation for most super-resolution imaging based on spatial frequency engineering. Diffractive units were fabricated on the chips surface to provide a wavevector-variable evanescent wave illumination and induce tunable deep SFS in the samples Fourier space. A resolution of {lambda}/4.7 for the label-free sample and {lambda}/7.1 for the labeled sample with a large FOV could be achieved with a CMOS-compatible process on a GaP chip. The large FOV, high-compatibility, and high-integration TVSFS chip may advance the fields like cell engineering, precision inspection in the industry, chemical research, etc.
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