Single holes confined in semiconductor quantum dots are a promising platform for spin qubit technology, due to the electrical tunability of the $g$-factor of holes. However, the underlying mechanisms that enable electric spin control remain unclear due to the complexity of hole spin states. Here, we present an experimental and theoretical study of the $g$-factor of a single hole confined in an isotopically enriched silicon planar MOS quantum dot. Electrical characterisation of the 3x3 $g$-tensor shows that local electric fields can tune the g-factor by 500%, and we observe a sweet spot where d$g_{(1overline{1}0)}$/d$V$ = 0, offering a configuration to suppress spin decoherence caused by electrical noise. Numerical simulations show that unintentional electrode-induced strain plays a key role in mediating the coupling of hole spins to electric fields in these spin-qubit devices. These results open a path towards a previously unexplored technology; premeditated strain engineering for hole spin-qubits.
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