This work presents a magnetic field imaging method based on color centres in diamond crystal applied to thin film structure. To demonstrate the capacity of our device we have used it for characterization of magnetic properties in microscopic scale of Cr$_2$O$_3$ thin film structure above and below Neel temperature. The obtained measurement results clearly identify the detection of the magnetic phase transition of Cr$_2$O$_3$ thin film with an unexpected diamagnetic like behaviour at 19$^{circ}$C (below the Neel temperature of Cr$_2$O$_3$). To have better insights in the magnetic fields created by the thin films we present simulations of the magnetic fields near the thin film surface. We also analysed the optically detected magnetic resonance (ODMR) profiles to be sure that the measured property is related only to the shift of the optically detected magnetic resonance. We demonstrate how Nitrogen-Vacancy centre based magnetometry can deliver a convenient platform for research of phase transition dynamics and spatial magnetic field distributions of thin films, that can rival other widely used measurement techniques.
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