Superconducting ($S$) thin film superlattices composed of Nb and a normal metal spacer ($N$) have been extensively utilized in Josephson junctions given their favorable surface roughness compared to Nb films of comparable thickness. In this work, we characterize the London penetration depth and Ginzburg-Landau coherence lengths of $S/N$ superlattices using polarized neutron reflectometry and electrical transport. Despite the normal metal spacer layers being only approximately 8% of the total superlattice thickness, we surprisingly find that the introduction of these thin $N$ spacers between $S$ layers leads to a dramatic increase in the measured London penetration depth compared to that of a single Nb film of comparable thickness. Using the measured values for the effective in- and out-of-plane coherence lengths, we quantify the induced anisotropy of the superlattice samples and compare to a single Nb film sample. From these results, we find that that the superlattices behave similarly to layered 2D superconductors.
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