We present resonant x-ray emission spectroscopic (RXES) data from the uranium intermetallics UPd$_3$, USb, USn$_3$ and URu$_2$Si$_2$, at the U $M_{4,5}$ edges and compare the data to those from the well-localized $5f^2$ semiconductor UO$_2$. The technique is especially sensitive to any oxidation of the surface, and this was found on the USb sample, thus preventing a good comparison with a material known to be $5f^3$. We have found a small energy shift between UO$_2$ and UPd$_3$, both known to have localized $5f^2$ configurations, which we ascribe to the effect of conduction electrons in UPd$_3$. The spectra from UPd$_3$ and URu$_2$Si$_2$,are similar, strongly suggesting a predominant $5f^2$ configuration for URu$_2$Si$_2$. The valence-band resonant inelastic x-ray scattering (RIXS) provides information on the U $P_3$ transitions (at about $18$~eV) between the U $5f$ and U $6p$ states, as well as transitions of between $3$ and $7$~eV from the valence band into the unoccupied $5f$ states. These transitions are primarily involving mixed ligand states (O $2p$ or Pd, Ru $4d$) and U $5f$ states. Calculations are able to reproduce both these low-energy transitions reasonably well.
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