A new model for the thermal spike produced by the nuclear energy loss, as source of transient processes, is derived analytically, for power law dependences of the diffusivity on temperature, as solution of the heat equation. The contribution of the ionizing energy loss to the spike is not included. The range of validity of the model is analysed, and the results are compared with numerical solutions obtained in the frame of the previous model of the authors, which takes into account both nuclear and ionization energy losses, as well as the coupling between the two subsystems in crystalline semiconductors. Particular solutions are discussed and the errors induced by these approximations are analysed.
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