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In 2011, a discrepancy between the values of the Planck constant measured by counting Si atoms and by comparing mechanical and electrical powers prompted a review, among others, of the measurement of the spacing of $^{28}$Si {220} lattice planes, either to confirm the measured value and its uncertainty or to identify errors. This exercise confirmed the result of the previous measurement and yields the additional value $d_{220}=192014711.98(34)$ am having a reduced uncertainty.
The measurement of the angle between the interferometer front mirror and the diffracting planes is a critical aspect of the Si lattice-parameter measurement by combined x-ray and optical interferometry. In addition to being measured off-line by x-ray
The possible occurence of highly deformed configurations is investigated in the $^{40}$Ca and $^{56}$Ni di-nuclear systems as formed in the $^{28}$Si+$^{12}$C,$^{28}$Si reactions by using the properties of emitted light charged particles. Inclusive a
We review the methods of constructing confidence intervals that account for a priori information about one-sided constraints on the parameter being estimated. We show that the so-called method of sensitivity limit yields a correct solution of the pro
We present the first world-wide inter-laboratory comparison of small-angle X-ray scattering (SAXS) for nanoparticle sizing. The measurands in this comparison are the mean particle radius, the width of the size distribution and the particle concentrat
This paper presents a direct method to obtain the deterministic and stochastic contribution of the sum of two independent sets of stochastic processes, one of which is composed by Ornstein-Uhlenbeck processes and the other being a general (non-linear