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Few-shot image classification aims at recognizing unseen categories with a small number of labeled training data. Recent metric-based frameworks tend to represent a support class by a fixed prototype (e.g., the mean of the support category) and make classification according to the similarities between query instances and support prototypes. However, discriminative dominant regions may locate uncertain areas of images and have various scales, which leads to the misaligned metric. Besides, a fixed prototype for one support category cannot fit for all query instances to accurately reflect their distances with this category, which lowers the efficiency of metric. Therefore, query-specific dominant regions in support samples should be extracted for a high-quality metric. To address these problems, we propose a Hierarchical Representation based Query-Specific Prototypical Network (QPN) to tackle the limitations by generating a region-level prototype for each query sample, which achieves both positional and dimensional semantic alignment simultaneously. Extensive experiments conducted on five benchmark datasets (including three fine-grained datasets) show that our proposed method outperforms the current state-of-the-art methods.
In this paper, we propose a subspace representation learning (SRL) framework to tackle few-shot image classification tasks. It exploits a subspace in local CNN feature space to represent an image, and measures the similarity between two images accord
While deep learning has been successfully applied to many real-world computer vision tasks, training robust classifiers usually requires a large amount of well-labeled data. However, the annotation is often expensive and time-consuming. Few-shot imag
Few-shot learning for fine-grained image classification has gained recent attention in computer vision. Among the approaches for few-shot learning, due to the simplicity and effectiveness, metric-based methods are favorably state-of-the-art on many t
Few-shot classification aims to recognize unlabeled samples from unseen classes given only few labeled samples. The unseen classes and low-data problem make few-shot classification very challenging. Many existing approaches extracted features from la
Few-shot image classification learns to recognize new categories from limited labelled data. Metric learning based approaches have been widely investigated, where a query sample is classified by finding the nearest prototype from the support set base