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We examine the effect of different sources of technical noise on inverse weak value-based precision phase measurements. We find that this type of measurement is similarly robust to technical noise as related experiments in the weak value regime. In particular, the measurements considered here are robust to additive Gaussian white noise and angular jitter noise commonly encountered in optical experiments. Additionally, we show the same techniques used for precision phase measurement can be used with the same technical advantages for optical frequency measurements.
We improve the precision of the interferometric weak-value-based beam deflection measurement by introducing a power recycling mirror, creating a resonant cavity. This results in emph{all} the light exiting to the detector with a large deflection, thu
We present an interferometric technique for measuring ultra-small tilts. The information of a tilt in one of the mirrors of a modified Sagnac interferometer is carried by the phase difference between the counter propagating laser beams. Using a small
In a quantum-noise limited system, weak-value amplification using post-selection normally does not produce more sensitive measurements than standard methods for ideal detectors: the increased weak value is compensated by the reduced power due to the
Recent advances in micro- and nanofabrication techniques have led to corresponding improvement in the performance of optomechanical systems, which provide a promising avenue towards quantum-limited metrology and the study of quantum behavior in macro
Weak measurement has been shown to play important roles in the investigation of both fundamental and practical problems. Anomalous weak values are generally believed to be observed only when post-selection is performed, i.e, only a particular subset