ﻻ يوجد ملخص باللغة العربية
We present a novel approach to pre-silicon verification of processor designs. The purpose of pre-silicon verification is to find logic bugs in a design at an early stage and thus avoid time- and cost-intensive post-silicon debugging. Our approach relies on symbolic quick error detection (Symbolic QED, or SQED). SQED is targeted at finding logic bugs in a symbolic representation of a design by combining bounded model checking (BMC) with QED tests. QED tests are powerful in generating short sequences of instructions (traces) that trigger bugs. We extend an existing SQED approach with symbolic starting states. This way, we enable the BMC tool to select starting states arbitrarily when generating a trace. To avoid false positives, (e.g., traces starting in unreachable states that may not be-have in accordance with the processor instruction-set architecture), we define constraints to restrict the set of possible starting states. We demonstrate that these constraints, togeth-er with reasonable assumptions about the system behavior, allow us to avoid false positives. Using our approach, we discovered previously unknown bugs in open-source RISC-V processor cores that existing methods cannot detect. Moreover, our novel approach out-performs existing ones in the detection of bugs having long traces and in the detection of hardware Trojans, i.e., unauthorized modifications of a design.
We present an industrial case study that demonstrates the practicality and effectiveness of Symbolic Quick Error Detection (Symbolic QED) in detecting logic design flaws (logic bugs) during pre-silicon verification. Our study focuses on several micro
Symbolic quick error detection (SQED) is a formal pre-silicon verification technique targeted at processor designs. It leverages bounded model checking (BMC) to check a design for counterexamples to a self-consistency property: given the instruction
We present Symbolic Quick Error Detection (Symbolic QED), a structured approach for logic bug detection and localization which can be used both during pre-silicon design verification as well as post-silicon validation and debug. This new methodology
Field programmable gate arrays (FPGAs) provide designers with the ability to quickly create hardware circuits. Increases in FPGA configurable logic capacity and decreasing FPGA costs have enabled designers to more readily incorporate FPGAs in their d
During post-silicon validation, manufactured integrated circuits are extensively tested in actual system environments to detect design bugs. Bug localization involves identification of a bug trace (a sequence of inputs that activates and detects the