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The identification of safe faults (i.e., faults which are guaranteed not to produce any failure) in an electronic system is a crucial step when analyzing its dependability and its test plan development. Unfortunately, safe fault identification is poorly supported by available EDA tools, and thus remains an open problem. The complexity growth of modern systems used in safety-critical applications further complicates their identification. In this article, we identify some classes of safe faults within an embedded system based on a pipelined processor. A new method for automating the safe fault identification is also proposed. The safe faults belonging to each class are identified resorting to Automatic Test Pattern Generation (ATPG) techniques. The proposed methodology is applied to a sample system built around the OpenRisc1200 open source processor.
With the scaling of technology and higher requirements on performance and functionality, power dissipation is becoming one of the major design considerations in the development of network processors. In this paper, we use an assertion-based methodolo
In this paper, we propose a very compact embedded CNN processor design based on a modified logarithmic computing method using very low bit-width representation. Our high-quality CNN processor can easily fit into edge devices. For Yolov2, our processi
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We present ESP4ML, an open-source system-level design flow to build and program SoC architectures for embedded applications that require the hardware acceleration of machine learning and signal processing algorithms. We realized ESP4ML by combining t
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